Depth chemical profile in a CeIr3 sample - Open Research Data - Bridge of Knowledge

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Depth chemical profile in a CeIr3 sample

Description

The polycrystalline sample of CeIr3 used in the present studies was synthesized by arc-melting cerium (4N) and iridium (3N5) in an arc furnace on a water-cooled copper hearth using a tungsten electrode under a high purity argon atmosphere. A piece of zirconium was used as an oxygen getter. First, a button of Ir was prepared by arc-melting the iridium powder pellet alone. The Ir ingot was then melted with Ce pieces with 3% excess to compensate expected loss of Ce. After the initial melt, the sample button was turned and re-melted several times (4-5) to improve homogeneity. Mass loss during the synthesis was lower than 1%, and the sample button formed was uniform, hard and silvery grey in color. The obtained sample was then wrapped in tantalum foil and annealed at 1370˚C for 12 hours under high vacuum (10-5 torr). Subsequently, the resulting material was ground well, pressed into a pellet using a hydraulic press and then heated under high vacuum to 1400˚C and held at this temperature for 36 hours.

To determine the valence state of cerium, X-ray photoelectron spectroscopy (XPS) was performed. The XPS measurement was performed using an Argus (Omicron NanoTechnology) X-ray photoelectron spectrometer. The photoelectrons were excited by a Mg-Ka X-ray source. The X-ray anode was operated at 15 keV and 300 W. The XPS measurement was performed at room temperature under ultra-high vacuum conditions, with pressures below 1.1 x10-8 mBar. It is known that the cerium at the surface tends to exist as Ce3+ rather than Ce4+.3 To avoid this surface impact, the CeIr3 sample was sputter-cleaned (three times) by Ar ions, (FDG 150 ion source mounted in the analytic chamber), before the XPS measurement.

 

 

Dataset file

CeIr3.zip
1.3 MB, S3 ETag 31759602bc235af611a32351844677c2-1, downloads: 44
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hexmd5(md5(part1)+md5(part2)+...)-{parts_count} where a single part of the file is 512 MB in size.

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download file CeIr3.zip

File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.
Software:
origin, Casa XPS

Details

Year of publication:
2021
Verification date:
2021-07-05
Creation date:
2018
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/q85g-vv44 open in new tab
Verified by:
Gdańsk University of Technology

Keywords

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