The AFM micrographs of vanadium oxides thin films deposited on silicon - the influence of the thickness of the film on morphology

Description

The DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a silicon substrate and were annealing at 300°C under synthetic air.

A Nanosurf Easyscan 2 AFM atomic force microscopy was used to examine the morphology of thin films.

Dataset file

Thickness slicon.zip

15.4 MB, S3 ETag 29a314ac4eef6c65e232031f18179c92-1, downloads: 46

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Attribution
Raw data:: Data contained in dataset was not processed.

Details

Year of publication:

2021

Verification date:

2021-06-22

Dataset language:

English

Fields of science:

materials engineering (Engineering and Technology)

DOI:

10.34808/w5pw-dv58

Series:

Vanadium oxides

Verified by:

Gdańsk University of Technology

Keywords

References

publication The influence of thermal conditions on V2O5 nanostructures prepared by sol-gel method

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