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Description
The DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.
X-ray diffraction patterns (XRD) were collected on a Philips X’PERT PLUS diffractometer with Cu Ka radiation (1.5406 Å) and ranging from 10 to 80 degrees.
The information about as-prepared thin film synthesis is described in the Journal of Nanomaterials.
Dataset file
XRD diff subs.zip
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cc9d4b437dc320888efba953191058fe-1,
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File details
- License:
-
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CC BYAttribution - Raw data:
- Data contained in dataset was not processed.
- Software:
- HighScore Plus
Details
- Year of publication:
- 2015
- Verification date:
- 2021-05-24
- Dataset language:
- English
- Fields of science:
-
- materials engineering (Engineering and Technology)
- DOI:
- DOI ID 10.34808/a6pf-rc57 open in new tab
- Series:
- Verified by:
- Gdańsk University of Technology
Keywords
References
- publication The influence of thermal conditions on V2O5 nanostructures prepared by sol-gel method
- publication Struktury nanokrystaliczne w układzie V O: wytwarzanie i właściwości
- dataset SEM micrographs of V2O5 thin film morphology dependent on substrate types
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