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A method of measuring RLC components for microcontroller systems

Abstract

A new method of measuring RLC components for microcontroller systems dedicated to compact smart impedance sensors based on a direct sensor-microcontroller interface is presented. In the method this direct interface composed of a reference resistor connected in series with the tested sensor impedance is stimulated by a square wave generated by the microcontroller, and then its voltage response is sampled by an internal ADC of the microcontroller. The obtained set of voltage samples is used to determine values of the sensor model impedance components.

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Category:
Articles
Type:
artykuły w czasopismach recenzowanych i innych wydawnictwach ciągłych
Published in:
Przegląd Elektrotechniczny pages 37 - 40,
ISSN: 0033-2097
Language:
English
Publication year:
2017
Bibliographic description:
Czaja Z.: A method of measuring RLC components for microcontroller systems// Przegląd Elektrotechniczny. -., nr. 10 (2017), s.37-40
DOI:
Digital Object Identifier (open in new tab) 10.15199/48.2017.10.08
Bibliography: test
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Gdańsk University of Technology

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