A method of measuring RLC components for microcontroller systems - Publication - Bridge of Knowledge

Search

A method of measuring RLC components for microcontroller systems

Abstract

A new method of measuring RLC components for microcontroller systems dedicated to compact smart impedance sensors based on a direct sensor-microcontroller interface is presented. In the method this direct interface composed of a reference resistor connected in series with the tested sensor impedance is stimulated by a square wave generated by the microcontroller, and then its voltage response is sampled by an internal ADC of the microcontroller. The obtained set of voltage samples is used to determine values of the sensor model impedance components.

Citations

  • 0

    CrossRef

  • 0

    Web of Science

  • 1

    Scopus

Cite as

Full text

download paper
downloaded 724 times
Publication version
Accepted or Published Version
License
Creative Commons: CC-BY-NC-ND open in new tab

Keywords

Details

Category:
Articles
Type:
artykuły w czasopismach recenzowanych i innych wydawnictwach ciągłych
Published in:
Przegląd Elektrotechniczny pages 37 - 40,
ISSN: 0033-2097
Language:
English
Publication year:
2017
Bibliographic description:
Czaja Z.: A method of measuring RLC components for microcontroller systems// Przegląd Elektrotechniczny. -., nr. 10 (2017), s.37-40
DOI:
Digital Object Identifier (open in new tab) 10.15199/48.2017.10.08
Verified by:
Gdańsk University of Technology

seen 182 times

Recommended for you

Meta Tags