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A solution of the integrated µBIST for functional and diagnostic testing in mixed-signal electronic embedded systems
Abstract
Main problem of the paper is testing of analog circuits and blocks in mixed-signal electronic embedded systems (EESs), using the built-in self-test (BIST) technique. The integrated mBIST based on reusing signal blocks already present in an EES, such as processors, memories, ADCs, is presented. The novelty of the solution is the extended functionality of the mBIST. It can perform 2 testing functions: functional testing and fault diagnosis on the level of localization of a faulty element. For functional testing, the complementary signals (CSs), and for fault diagnosis the SBT vocabulary techniques have been used.
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- Category:
- Conference activity
- Type:
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Title of issue:
- 12th IMEKO TC10 Workshop on Technical Diagnastics: new perspectives in measurements, tools and techniques for industrial applications. - proceedings
- Language:
- English
- Publication year:
- 2013
- Bibliographic description:
- Załęski D., Zielonko R.: A solution of the integrated µBIST for functional and diagnostic testing in mixed-signal electronic embedded systems// 12th IMEKO TC10 Workshop on Technical Diagnastics: new perspectives in measurements, tools and techniques for industrial applications. - proceedings/ ed. M. Catelani Florence: University of Florence, Dept. of Information Engineering, 2013,
- Verified by:
- Gdańsk University of Technology
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