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Characteristics of an image sensor with early-vision processing fabricated in standard 0.35 µm CMOS technology
Abstract
The article presents measurement results of prototype integrated circuits for acquisition and processing of images in real time. In order to verify a new concept of circuit solutions of analogue image processors, experimental integrated circuits were fabricated. The integrated circuits, designed in a standard 0.35 µm CMOS technology, contain the image sensor and analogue processors that perform low-level convolution-based image processing algorithms. The prototype with a resolution of 32 x 32 pixels allows the acquisition and processing of images at high speed, up to 2000 frames/s. Operation of the prototypes was verified in practice using the developed software and a measurement system based on a FPGA platform.
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- Accepted or Published Version
- DOI:
- Digital Object Identifier (open in new tab) 10.2478/v10178-012-0017-8
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- Category:
- Articles
- Type:
- artykuł w czasopiśmie wyróżnionym w JCR
- Published in:
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Metrology and Measurement Systems
no. XIX,
pages 191 - 202,
ISSN: 0860-8229 - Language:
- English
- Publication year:
- 2012
- Bibliographic description:
- Jendernalik W., Jakusz J., Blakiewicz G., Szczepański S., Piotrowski R.: Characteristics of an image sensor with early-vision processing fabricated in standard 0.35 µm CMOS technology// Metrology and Measurement Systems. -Vol. XIX, nr. iss. 2 (2012), s.191-202
- DOI:
- Digital Object Identifier (open in new tab) 10.2478/v10178-012-0017-8
- Verified by:
- Gdańsk University of Technology
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