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Abstract
Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones potential, approximated by the van der Waals force in a long-range interaction. Here we present a general framework of approximation of the tip motion by adding three terms of Taylor series what results in non-zero harmonics in an output signal. We have worked out a measurement system which allows recording of an excitation tip signal and its non-linear response. The first studies of spectrum showed that presence of the second and the third harmonics in cantilever vibrations may be observed and used as a new method of the investigated samples characterization.
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- Accepted or Published Version
- DOI:
- Digital Object Identifier (open in new tab) 10.2478/bpasts-2013-0053
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- Category:
- Articles
- Type:
- artykuł w czasopiśmie wyróżnionym w JCR
- Published in:
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Bulletin of the Polish Academy of Sciences-Technical Sciences
no. 61,
edition 2,
pages 535 - 539,
ISSN: 0239-7528 - Language:
- English
- Publication year:
- 2013
- Bibliographic description:
- Babicz-Kiewlicz S., Smulko J., Zieliński A.: Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis// Bulletin of the Polish Academy of Sciences-Technical Sciences. -Vol. 61, iss. 2 (2013), s.535-539
- DOI:
- Digital Object Identifier (open in new tab) 10.2478/bpasts-2013-0053
- Verified by:
- Gdańsk University of Technology
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