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Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis

Abstract

Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones potential, approximated by the van der Waals force in a long-range interaction. Here we present a general framework of approximation of the tip motion by adding three terms of Taylor series what results in non-zero harmonics in an output signal. We have worked out a measurement system which allows recording of an excitation tip signal and its non-linear response. The first studies of spectrum showed that presence of the second and the third harmonics in cantilever vibrations may be observed and used as a new method of the investigated samples characterization.

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DOI:
Digital Object Identifier (open in new tab) 10.2478/bpasts-2013-0053
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Details

Category:
Articles
Type:
artykuł w czasopiśmie wyróżnionym w JCR
Published in:
Bulletin of the Polish Academy of Sciences-Technical Sciences no. 61, edition 2, pages 535 - 539,
ISSN: 0239-7528
Language:
English
Publication year:
2013
Bibliographic description:
Babicz-Kiewlicz S., Smulko J., Zieliński A.: Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis// Bulletin of the Polish Academy of Sciences-Technical Sciences. -Vol. 61, iss. 2 (2013), s.535-539
DOI:
Digital Object Identifier (open in new tab) 10.2478/bpasts-2013-0053
Verified by:
Gdańsk University of Technology

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