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Abstract
In the paper, a method of estimation of parameters of Gaussian and non-Gaussian components in the noise signal of semiconductor devices in a frequency domain is proposed. The method is based on composing estimators of two spectra, corresponding to noise (Gaussian component) and two-level RTS noise (non-Gaussian component). The proposed method can be applied for precise evaluation of the corner RTS frequency fRTS in the noise spectrum.
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- DOI:
- Digital Object Identifier (open in new tab) 10.2478/s11772-008-0073-5
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- Category:
- Articles
- Type:
- artykuł w czasopiśmie wyróżnionym w JCR
- Published in:
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OPTO-ELECTRONICS REVIEW
no. 17,
pages 236 - 241,
ISSN: 1230-3402 - Language:
- English
- Publication year:
- 2009
- Bibliographic description:
- Stawarz-Graczyk B., Szewczyk A., Konczakowska A.: Identification of inherent noise components of semiconductor devices on an example of optocouplers// OPTO-ELECTRONICS REVIEW. -Vol. 17, nr. nr 2 (2009), s.236-241
- DOI:
- Digital Object Identifier (open in new tab) 10.2478/s11772-008-0073-5
- Verified by:
- Gdańsk University of Technology
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