Abstract
The system based on spatially resolved optical emission spectroscopy dedicated for in situ diagnostics of plasma assisted CVD processes is presented in this paper. Measurement system coupled with chemical vapour deposition chamber by dedicated fiber-optic paths enables investigation of spatial distribution of species densities (Hx, H+, CH, CH+) during chemical vapour deposition process. Experiments were performed for a various gas inlet configuration at range of microwave power up to 800 W. Spatially resolved optical spectroscopy results showed that inlet configuration based on injecting hydrogen in ECR region and methane in substrate area is the most eficient for H+ and CH+3 excitation. The designed prototype of the spatially resolved optical spectroscopy system enables the high-sensitivity measurements of concentration of the species in the microwave plasma and can be used for optimisation of diamond-like carbon synthesis.
Author (1)
Cite as
Full text
- Publication version
- Accepted or Published Version
- License
- open in new tab
Keywords
Details
- Category:
- Articles
- Type:
- artykuł w czasopiśmie z listy filadelfijskiej
- Published in:
-
ACTA PHYSICA POLONICA A
no. 114,
ISSN: 0587-4246 - Language:
- English
- Publication year:
- 2008
- Bibliographic description:
- Bogdanowicz R.: Investigation of H2:CH4 plasma composition by means of spatially resolved optical spectroscopy// ACTA PHYSICA POLONICA A. -Vol. 114., nr. nr 6-A (2008),
- Verified by:
- Gdańsk University of Technology
seen 109 times
Recommended for you
Long-working-distance Raman system for monitoring of uPA ECR CVD process of thin diamond/DLC layers growth
- M. Gnyba,
- M. Kozanecki,
- B. Kosmowski
- + 2 authors
Mobility measurements in oxide semiconductors
- E. Prociów,
- M. S. Łapiński,
- J. Domaradzki
- + 3 authors