The Application of Kernel Density Estimation for Aided the Process of Locating Sources of Voltage Fluctuations - Publication - Bridge of Knowledge

Search

The Application of Kernel Density Estimation for Aided the Process of Locating Sources of Voltage Fluctuations

Abstract

Citations

  • 1

    CrossRef

  • 0

    Web of Science

  • 1 0

    Scopus

Author (1)

Cite as

Full text

full text is not available in portal

Details

Category:
Magazine publication
Type:
Magazine publication
Published in:
Przegląd Elektrotechniczny no. 1, edition 8, pages 72 - 76,
ISSN: 0033-2097
ISSN:
0033-2097
Publication year:
2019
DOI:
Digital Object Identifier (open in new tab) 10.15199/48.2019.08.18
Verified by:
No verification

seen 81 times

Meta Tags