Abstract
This work presents the result of structure investigations ofV 2O5 nanorods grown from thin films and powders prepared by sol-gel method. To examine the best temperature of nanorods crystallization, thin films deposited by spin-coating method on quartz glass or silicon substrates and bulk xerogel powders were annealed at various temperatures ranging from 100∘C to 600∘C. The structure of the samples was characterized by X-ray diffraction method (XRD), scanning electron microscope (SEM), differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), and mass spectroscopy (MS). The rod-like structure of V2O5 was obtained at 600∘C on both quartz glass and silicon substrates and also from the bulk xerogel. The growth process and the effect of annealing treatment on the nanostructure are briefly discussed.
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Details
- Category:
- Articles
- Type:
- artykuł w czasopiśmie wyróżnionym w JCR
- Published in:
-
Journal of Nanomaterials
no. 2015,
pages 1 - 8,
ISSN: 1687-4110 - Language:
- English
- Publication year:
- 2015
- Bibliographic description:
- Prześniak-Welenc M., Łapiński M. S., Lewandowski T., Kościelska B., Wicikowski L., Sadowski W.: The influence of thermal conditions on V2O5 nanostructures prepared by sol-gel method// Journal of Nanomaterials. -Vol. 2015, (2015), s.1-8
- DOI:
- Digital Object Identifier (open in new tab) 10.1155/2015/418024
- Verified by:
- Gdańsk University of Technology
Referenced datasets
- dataset The AFM micrographs of vanadium oxides thin films obtained at 800°C
- dataset Cycling performances of the V2O5 nanorods as cathode material in Li-ion batteries
- dataset Rate performance of the V2O5 nanocrystals as cathode material in Li-ion batteries
- dataset The AFM micrographs of vanadium oxides thin films obtained at 1200°C
- dataset SEM micrographs of morphology evolution of V2O5 thin films on quartz glass
- dataset XRD patterns of V2O5 thin films deposited on silicon substrate
- dataset The AFM micrographs of vanadium oxides thin films obtained at 400°C
- dataset XRD patterns of the V2O5 nanorods after thermal treatment under reducing atmosphere
- dataset XRD patterns of V2O5 thin films deposited on quartz glass
- dataset The AFM micrographs of vanadium oxides thin films obtained at 600°C
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