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Abstract
This work presents the result of structure investigations ofV 2O5 nanorods grown from thin films and powders prepared by sol-gel method. To examine the best temperature of nanorods crystallization, thin films deposited by spin-coating method on quartz glass or silicon substrates and bulk xerogel powders were annealed at various temperatures ranging from 100∘C to 600∘C. The structure of the samples was characterized by X-ray diffraction method (XRD), scanning electron microscope (SEM), differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), and mass spectroscopy (MS). The rod-like structure of V2O5 was obtained at 600∘C on both quartz glass and silicon substrates and also from the bulk xerogel. The growth process and the effect of annealing treatment on the nanostructure are briefly discussed.
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- Category:
- Articles
- Type:
- artykuł w czasopiśmie wyróżnionym w JCR
- Published in:
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Journal of Nanomaterials
no. 2015,
pages 1 - 8,
ISSN: 1687-4110 - Language:
- English
- Publication year:
- 2015
- Bibliographic description:
- Prześniak-Welenc M., Łapiński M. S., Lewandowski T., Kościelska B., Wicikowski L., Sadowski W.: The influence of thermal conditions on V2O5 nanostructures prepared by sol-gel method// Journal of Nanomaterials. -Vol. 2015, (2015), s.1-8
- DOI:
- Digital Object Identifier (open in new tab) 10.1155/2015/418024
- Verified by:
- Gdańsk University of Technology
Referenced datasets
- dataset XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
- dataset XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
- dataset SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 800°C
- dataset The AFM micrographs of vanadium oxides thin films deposited on silicon - the influence of the thickness of the film on morphology
- dataset Structure evolution of V2O5 thin films deposited on quartz glass substrate - High-Temperature X-ray Diffraction
- dataset XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
- dataset SEM micrographs of V2O5 thin films deposited on isotropic etching silicon substrates (111)
- dataset The AFM micrographs of V2O5 single crystals
- dataset SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1000°C
- dataset Structure evolution of V2O5 thin films deposited on silicon substrate - High-Temperature X-ray Diffraction
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