Mirrors are used in optical sensors and measurement setups. This creates a demand for mirrors made of new materials and having various properties tailored to specific applications. In this work, we propose silicon covered with a thin silicon nitride layer as a mirror for near-infrared measurements. SiN layer was deposited on a standard silicon wafer with a Low-Pressure Chemical Vapor Deposition furnace. Then, the created layer...

Few-layer black phosphorus (FLBP) is a 2D material that gains worldwide interest for its possible applications, mainly in electronics and optoelec-tronics. However, as FLBP is prone to a degradation process under envi-ronmental conditions, there is a need for a monitoring method allowing investigation of its surface quality. Among many techniques, optoelectronic ones have unique advantages of fast response, non-contact, and non-invasive...

Verification of measurement errors has a big impact on assessment of accuracy of conducted measurements and obtained results. In many cases computer simulation results are compared with measurement results in order to evaluate measurement errors. The purpose of our research was to check the accuracy of measurements made with Fabry-Perot interferometer working in the transmission mode. In measurement setup, a 1310 nm superluminescent...