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(Field of Science):
- automation, electronics, electrical engineering and space technologies (Engineering and Technology)
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Ministry points: Help
| Year | Points | List |
|---|---|---|
| Year 2024 | 100 | Ministry scored journals list 2024 |
| Year | Points | List |
|---|---|---|
| 2024 | 100 | Ministry scored journals list 2024 |
| 2023 | 100 | Ministry Scored Journals List |
| 2022 | 100 | Ministry Scored Journals List 2019-2022 |
| 2021 | 100 | Ministry Scored Journals List 2019-2022 |
| 2020 | 100 | Ministry Scored Journals List 2019-2022 |
| 2019 | 100 | Ministry Scored Journals List 2019-2022 |
| 2018 | 35 | A |
| 2017 | 35 | A |
| 2016 | 35 | A |
| 2015 | 35 | A |
| 2014 | 35 | A |
| 2013 | 35 | A |
| 2012 | 35 | A |
| 2011 | 35 | A |
| 2010 | 32 | A |
Model:
Points CiteScore:
| Year | Points |
|---|---|
| Year 2022 | 7.4 |
| Year | Points |
|---|---|
| 2022 | 7.4 |
| 2021 | 6.7 |
| 2020 | 5.8 |
| 2019 | 5.2 |
| 2018 | 4.5 |
| 2017 | 4.5 |
| 2016 | 4.8 |
| 2015 | 4.5 |
| 2014 | 4.2 |
| 2013 | 4 |
| 2012 | 3.7 |
| 2011 | 4.3 |
Impact Factor:
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Papers published in journal
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total: 9
Catalog Journals
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ALD thin ZnO layer as an active medium in a fiber-optic Fabry–Perot interferometer
Publication -
Interface circuit for impedance sensors using two specialized single-chip microsystems
PublicationW artykule przedstawiono obwód interfejsu przeznaczony do pomiaru parametrów impedancyjnych czujników lub celek pomiarowych instalowanych na obiektach technicznych. Umożliwia on pomiar modułu i argumentu impedancji w zakresie 10ohm
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A microcontroller system for measurement of three independent components in impedance sensors using a single square pulse
PublicationOpracowano nową metodę pomiaru w dziedzinie czasu i wyznaczania trzech składowych elementów modelu czujnika impedancyjnego oraz zaimplementowano ją w inteligentnym czujniku impedancji sterowanym 8-bitowym mikrokontrolerem. Metoda bazuje na pobudzeniu dzielnika napięciowego składającego się z rezystora pełniącego funkcję konwertera prąd na napięcie i z czujnika impedancji pojedynczym impulsem prostokątnym o czasie trwania T bezpośrednio...
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Time-domain measurement methods for R, L and C sensors based on aversatile direct sensor-to-microcontroller interface circuit
PublicationtIn the paper new time-domain measurement methods for determining values of resistive (R), inductive(L) and capacitive (C) sensors based on a versatile direct sensor-to-microcontroller interface for microcon-trollers with internal analog-to-digital converters (ADCs) and analog comparators (ACs) are presented.The interface circuit consists of a reference resistor Rrworking as a voltage divider, a given R, L or C sensorand a microcontroller...
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Polarization sensitive optical coherence tomography for technical materials investigation
Publication -
ZnO coated fiber optic microsphere sensor for the enhanced refractive index sensing
PublicationOptical fiber-based sensors are expected to become key components in the control of industrial processes,and the tuning and the enhancement of their sensing properties are crucial for the further developmentof this technology. Atomic Layer Deposition (ALD), a vapor phase technique allowing for the deposition ofconformal thin films, is particularly suited for the deposition of controllable thin films on challenging sub-strates....
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Spectroscopic wireless sensor of hematocrit level
PublicationAn optical method for hematocrit measurement is presented. The sensor, designed and developed by authors, consists of a spectroscopic set-up and a microcontroller. The work of the sensor is based on measurement of intensity of two selected spectral bands. Tests confirmed the ability of the sensor to determine the hematocrit level with appropriate measurement accuracy. Measurement results can be transmitted via wireless module to...
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ALD thin ZnO layer as an active medium in a fiber-optic Fabry-Perot interferometer
Publication.
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Polarization sensitive optical coherence tomography for technical materials investigation
PublicationZaprezentowano system optycznej tomografii koherentnej z analizą stanu polaryzacji światła. System umożliwia nieniszczące i bezkontaktowe badanie wewnętrznej struktury materiałów warstwowych. Przedstawiono zastosowaną metodę analizy stanu polaryzacji promieniowana wstecznie rozproszonego od badanego obiektu.
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