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Open Research Data
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Złocieniec 2021- video data - pedestrian, bicycles, vehicles
Open Research DataZłocieniec 2021- video data - pedestrian, bicycles, vehicles
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Zeiss calibration dataset for high-precision 3D measurement of large industrial components
Open Research DataThe dataset is a collection of images, 2D image points, and 3D points. It serves to calibrate a multi-camera robot system for high-precision measurements of large industrial components (more than 1m x 1m). In particular, the system uses a 3D scanner mounted on a robot manipulator and multiple cameras attached to an external frame outside of the robot...
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XRD (X-ray diffraction) spectra of bulk boron and obtained borophene
Open Research DataThis dataset includes XRD (X-ray diffraction) spectra of bulk boron and borophene obtained during sonication process, giving the information on the phase composition and crystallinity of materials.
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XRD (X-ray diffraction) patterns of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide), ex-WS2 (exfoliated tungsten disulfide) and GO (graphene oxide)
Open Research DataThese data contain XRD (X-ray diffraction) patterns of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide), ex-WS2 (exfoliated tungsten disulfide) and GO (graphene oxide). The data were collected for samples obtained from three ex-WS2:GO dispersions - with 1:1, 1:2, and 2:1 weight ratios.
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XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al)
Open Research DataThese data contain XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al). The results were recorded by a Philipsdiffractometer using Cu Ka radiation. Sample abbreviations (PMH, PMD, MIL-53(Al)) are in agreement with the markings used in the linked publication.
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XRD (X-ray Diffraction) of TNRs (titanium dioxide nanorods)
Open Research DataThis dataset contains XRD (X-ray Diffraction) diffractograms of TNR (titanium dioxide nanorods). The detailed equipment and measurement data was described in "readme XRD.txt" file.
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XRD (X-ray Diffraction) of titanium dioxide coated nickel foams
Open Research DataThese data include XRD patterns of titanium dioxide coated nickel foams heated at 400, 500 and 600C in argon atmosphere.
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XRD-TiO2 heat-treated at 400-600oC in Ar or H2
Open Research DataThese data contain XRD patterns of TiO2 heat-treated at 400-600oC in Ar or H2. Two pases of TiO2 were identified: anatase and rutile.
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XRD-TiO2 and SiO2
Open Research DataData contain results from XRD measurements of amorphous silica and TiO2 of antase and rutile phases. The commercial TiO2 named as P25 produced by Evonik was also analyzed.
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XRD results of melamine sponges impregnated by DES
Open Research DataThe set includes raw data from XRD analysis of pure melamine sponge and melamine sponges impregnated by:- Eucalyptol:Menthol (1:1)- Eucalyptol:Menthol (1:2)- Eucalyptol:Menthol (1:3)- Eucalyptol:Menthol (1:4)- Eucalyptol:Menthol (1:5)- Thymol:Menthol (1:1)
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XRD patterns of VO2 and V6O13 nanostructures
Open Research DataThe DataSet contains the XRD patterns of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 500, 600 and 700C for 10h.
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XRD patterns of VO2 and V2O3 thin films obtained at 700°C
Open Research DataThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (5-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon atmosphere.
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XRD patterns of VO2 and V2O3 thin films obtained at 500°C
Open Research DataThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 500°C under an argon atmosphere.
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XRD patterns of VO2 and V2O3 nanostructures
Open Research DataThe DataSet contains the XRD patterns of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-1000C. The results show that the morphology...
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Open Research DataThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Open Research DataThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of V2O5 thin films deposited on silicon substrate
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range of 300-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of V2O5 thin films deposited on quartz glass
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were obtained by the sol-gel method. ...
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XRD patterns of V2O5 thin film morphology dependent on substrate types
Open Research DataThe DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.