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  • Tellurite based glass doped by Eu3+ ions - XPS measurements

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    Eu3+ doped tellurite glass ceramics containing SrF2 nanocrystals were prepared using melt quenching technique and subsequent heat treatment of glass in 370 °C for different time periods. Thermal properties of glass matrix have been determined based on DSC measurements. XRD and XPS results confirmed formation of SrF2 nanocrystals in glass matrices after...

  • Dewetting of silver films detected by XPS method

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    Dewetting of silver thin films was detected by XPS method. Thin metallic films were deposited by magnetron sputtering method. Formation of nanostructures , as a result of thermal annealing, was confirmed by SEM microscope. For comparision three samples were measured. Bulg gold, as-deposited silver film with thickness of 3 nm and nanostructures.

  • Formation of gold nanostructures detected by XPS method

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    Gold nanostructers were manufactured by thermal dewetting of thin film. Film with thickness of 2.8 nm was deposited by magnetron sputtering method. As a result of annealing at 550 deg, nanostructures appear. Bulk gold, as-deposited gold film and metallic nanostructures were measured by XPS method. 

  • Depth XPS profile of Fe-S layers on a titanium substrate

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    Depth XPS profile of Fe-S layers on a titanium substrate was measured. Material was etched by Argon ion gun and measured by XPS method. For each sample, three times per 10 minutes each was sputtered.

  • Chemical properties of bismuth telluride – carbon composites.

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    Carbon nanotubes and amorphous carbon have been introduced into bismuth telluride matrix (in 0.15 and 0.30 wt % ratio) in order to investigate influence of carbon on composite’s thermoelectric properties. Composites with well-dispersed additives have been obtained by sonication and ball-milling. Chemical composition of materials was confirmed by XPS...

  • Morphology of the gold nanoislands

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    Dewetting of the thin metallic films leads to formation of an isolated islands. morphology of nanostructures was measured by SEM microscope. Thin gold films with a thickness of 1.2 nm, 1.5 nm and 3.4 nm were anealed at 550, 600 and 650 Celcius degress.

  • Optical transmission of the Niobium thin films

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    Niobium thin films with a thickness of 200nm were deposited n a Corning glass substrate by magnetron sputtering method. The optical transmission spectra in a visible light range were.recorded. Investigations showed a good optical transmission thru the layers for each samples, annealed at various temperatures. For measurements samples annealed at 500,...

  • XRD analysis of the tellurium dioxide thin films

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    Tellurium dioxide thin films were deposited by magnetron sputtering method. The XRD analysis of the films annealed at 200, 500, 650 and 700 celsius degree showed appearing of crystalline phase in a higher temeratures.

  • Ultra-thin film of aluminum oxide influence on the plasmon resonance in gold nanostructures

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    Ultra-thin film of aluminum oxide influence on the plasmon resonance in gold nanostructures was measured by UV-VIS spectroscopy. Ultra thin film of Al2O3 was deposited on a gold nanostructures. Thickness of film was 2nm - 8nm. Shift of plasmon resonance was observed, as a result of various dielectric constant of layer.

  • TEM imaging of metal nanoparticle cross section

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    TEM microscope was used for a imaging of metallic nanostructures. Metallic nanostructures were manufactured by thermal annealing of thin films. Gold and silver nanostructures were chosen for measurements. Samples were annealed for 15 and 60 minutes at 550 deg.

  • Interface diffusion between metallic nanoparticles and silicon substrate

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    Interface diffusion between metallic nanoparticles and silicon substrate was detected by EDX method. Metallic nanostructures were manufactured by thermal annealing of thin films. Gold and silver nanostructures were chosen for measurements. Samples were annealed for 15 and 60 minutes at 550 deg.

  • Long-term measurement of physiological parameters - patient 7 (serie 6)

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    The data set was obtained during the project focus on the determination of changes in physiological parameters due to a stressful situation.The measurements were conducted with the system which consists e.g. sensors of temperature, skin resistance, and pulse.A long-term (2.5 hours) measurement of physiological parameters was performed on the healthy...

  • Structural analysis of the tellurium dioxide thin films

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    TeO2 thin films were deposited by magnetron sputtering method. After deposition, amorphous samples were annealed at various temperatures. Influence of annealing temperature on a presence of crystalline phase was investigated.

  • Optical properties of MnO-B2O3 based glass

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    MnO-B2O3 based glass with Au nanoparticles samples were  annealing for a various time (in a range of 24-96 hours) at various temperatures (from 340 up to 350 deg.). Presence of silver nanoparticles was detected by UV-VIS measurements. On the basis of change optical bandgap, Ag NPs was detected.

  • Morphology of the sol-gel derived LTO:Cu films

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    Morphology of the lithium titanate doped by Cu thin films were investigated by SEM microscope. Films were deposited by spin-coater from sol-gel derived sol. SEM images showed a high porous structure, tipaciall for sol-gel based films. For measurements samples with a various content of Cu were selected.

  • Optical measurements of LTO:Cu sol-gel derived thin films

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    Lithium titanate doped by copper thin films were manufactured by chemical, sol-gel method. Flms were deposited on a Corning glass substrated by spin coater. To calculated optical band gap and other optcal parameters, UV-VIS spectroscopy measurements were performed. For measurements selected samples with various content of Cu.

  • Impedance spectroscopy of the lithium titanate doped by copper thin films

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    Lithium titanate doped by copper thin films were derived by sol-gel method. Prepared gel was deposited by spin-coating technique. Samples with various content of Cu were measured by impedance spectroscopy method in a wide range of temperature, from -120 up to 150 deg.

  • Structural investigations of the LTO:Cu thin films

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    Lithium titanate (Li1+xTi2-xO4) doped with Cu2+ ions was synthesized by sol-gel processing method. The structure was characterized by X-ray Diffraction (XRD). All samples revealed presence of LTO spinel phase. X-ray pattern of undoped LTO was free of any impurities and other crystal phases. Similarly, samples with low amount of copper dopant (x = 0.05...

  • Analysis of the electrical parameters of the LTO thin films

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    Lithium titanate thin films were derived by sol-gel technique. Films with thickness ca. 800 nm were annealed for various time, in a range of 10h-80h at 550 deg. Electrical conductivity in a wide range of temperature was measured.

  • XRD investigations of the lithium titanate thin films

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    Nanocrystalline thin films with 800 nm thickness were prepared by sol–gel method. To examine the influence of the annealing temperature on as-prepared films crystallization, the coatings were heated at temperature from 500 °C up to 600 °C  for 20h. Structure of manufactured thin films was investigated using X-ray diffraction (XRD). The most visible...

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