Scanning electron microscopy (SEM) images of the boron-doped carbon nanowalls surfaces - Open Research Data - MOST Wiedzy

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Scanning electron microscopy (SEM) images of the boron-doped carbon nanowalls surfaces

Description

The dataset contains the scanning electron micrographs (SEM), revealing the surface morphology of boron-doped carbon nanowalls electrodes on silicon substrates. The surface is characterized by nano-walled structures. The obtained electrodes were doped with boron at the level of [B]/[C] = 5000ppm  in the gas atmosphere during the synthesis.

The selected micrographs were utilized when preparing the manuscript published in Acta Materialia: DOI 10.1016/j.actamat.2021.116989

Dataset file

SEM_SERIES5.zip
22.7 MB, S3 ETag d1a1f88d97eeffd4145349d4360ec5ae-1, downloads: 0
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File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.

Details

Year of publication:
2022
Verification date:
2022-07-29
Dataset language:
English
Fields of science:
  • Materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/134v-v963 open in new tab
Funding:
Verified by:
Gdańsk University of Technology

Keywords

References

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