Description
The dataset contains the scanning electron micrographs (SEM), revealing the surface morphology of boron-doped carbon nanowalls electrodes on silicon substrates. The surface is characterized by nano-walled structures. The obtained electrodes were doped with boron at the level of [B]/[C] = 1200ppm in the gas atmosphere during the synthesis.
The selected micrographs were utilized when preparing the manuscript published in Advanced Materials Interfaces: DOI 10.1002/admi.202100464
Dataset file
SEM_SERIES3.zip
42.4 MB,
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4274e93d9a65ab43937f890d3fc1ee5c-1,
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File details
- License:
-
open in new tabCC BYAttribution
- Raw data:
- Data contained in dataset was not processed.
Details
- Year of publication:
- 2022
- Verification date:
- 2024-02-08
- Dataset language:
- English
- Fields of science:
-
- materials engineering (Engineering and Technology)
- DOI:
- DOI ID 10.34808/j6sh-mn09 open in new tab
- Funding:
- Verified by:
- Gdańsk University of Technology
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