Scanning electron microscopy (SEM) images of the boron-dopied carbon nanowalls surfaces - Open Research Data - Bridge of Knowledge

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Scanning electron microscopy (SEM) images of the boron-dopied carbon nanowalls surfaces

Description

The dataset contains the scanning electron micrographs (SEM), revealing the surface morphology of boron-doped carbon nanowalls electrodes on silicon substrates. The surface is characterized by nano-walled structures. The obtained electrodes were doped with boron at the level of [B]/[C] = 1200ppm  in the gas atmosphere during the synthesis.

The selected micrographs were utilized when preparing the manuscript published in Advanced Materials Interfaces: DOI 10.1002/admi.202100464

Dataset file

SEM_SERIES3.zip
42.4 MB, S3 ETag 4274e93d9a65ab43937f890d3fc1ee5c-1, downloads: 2
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download file SEM_SERIES3.zip

File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.

Details

Year of publication:
2022
Verification date:
2024-02-08
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/j6sh-mn09 open in new tab
Funding:
Verified by:
Gdańsk University of Technology

Keywords

References

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