Structural analysis of the tellurium dioxide thin films - Open Research Data - Bridge of Knowledge

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Structural analysis of the tellurium dioxide thin films

Description

TeO2 thin films were deposited by magnetron sputtering method. After deposition, amorphous samples were annealed at various temperatures. Influence of annealing temperature on a presence of crystalline phase was investigated.

Dataset file

TeO2.zip
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File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.

Details

Year of publication:
2021
Verification date:
2021-06-23
Creation date:
2017
Dataset language:
English
Fields of science:
  • Materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/rqzr-sy71 open in new tab
Verified by:
Gdańsk University of Technology

Keywords

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