TEM imaging of Ag-Au nanoalloys - Open Research Data - Bridge of Knowledge

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TEM imaging of Ag-Au nanoalloys

Description

The nanostructures of AuAg nanoalloys were prepared by sequential sputtering of metal thin layers (Au/Ag or Ag/Au) followed by annealing under 550 Celsius degree in an argon atmosphere. The basic single layer thickness was usually ca. 3 nm. For investigations two samples wih 50% Au and 50% Ag were selected and samples 1/3 Ag - 2/3 Au and 2/3 Ag - 1/3 Au. The analytical Transmission Electron Microscopy (TEM) investigations were performed on a JOEL JEM ARM 200F HR TEM apparatus equipped with an EDS detector. For nanograin structure and chemical composition, several TEM techniques were used, including conventional and High-Resolution imaging (TEM/HRTEM). TEM and EDX investigations showed thet obtained nanoislands are homogeneous, which suggests alloy formation rather than fully separated type structures.

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TEM EDX.zip
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Creative Commons: by 4.0 open in new tab
CC BY
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Details

Year of publication:
2021
Verification date:
2021-07-13
Creation date:
2019
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/pqcm-hq82 open in new tab
Verified by:
Gdańsk University of Technology

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