TEM imaging of metal nanoparticle cross section

Description

TEM microscope was used for a imaging of metallic nanostructures. Metallic nanostructures were manufactured by thermal annealing of thin films. Gold and silver nanostructures were chosen for measurements. Samples were annealed for 15 and 60 minutes at 550 deg.

Dataset file

TEM.zip

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CC BY

Attribution
Raw data:: Data contained in dataset was not processed.

Details

Year of publication:

2021

Verification date:

2021-06-24

Creation date:

2019

Dataset language:

English

Fields of science:

materials engineering (Engineering and Technology)

DOI:

10.34808/vs02-r577

Verified by:

Gdańsk University of Technology

Keywords

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Authors

Marcin Stanisław Łapiński dr hab. inż.
Institute of Nanotechnology and Materials Engineering
orcid number 0000-0002-3283-2886open in new tab
Creator

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