TEM imaging of metal nanoparticle cross section - Open Research Data - Bridge of Knowledge

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TEM imaging of metal nanoparticle cross section

Description

TEM microscope was used for a imaging of metallic nanostructures. Metallic nanostructures were manufactured by thermal annealing of thin films. Gold and silver nanostructures were chosen for measurements. Samples were annealed for 15 and 60 minutes at 550 deg.

Dataset file

TEM.zip
105.9 MB, S3 ETag 6826976936b22f9ba7cf67c537a950ef-1, downloads: 5
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File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.

Details

Year of publication:
2021
Verification date:
2021-06-24
Creation date:
2019
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/vs02-r577 open in new tab
Verified by:
Gdańsk University of Technology

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