The scanning spreading resistance microscopy (SSRM) studies of heavy boron-doped diamond oxidation under high-temperature - Open Research Data - Bridge of Knowledge

Your account

login

Search

The scanning spreading resistance microscopy (SSRM) studies of heavy boron-doped diamond oxidation under high-temperature

Description

The dataset contains the results of scanning spreading resistance microscopy (SSRM) of heavy boron-doped diamond (BDD) electrodes subjected to high-temperature oxidation in a furnace at 600 Celsius. The micrographs reveal the local change of electric properties at certainly crystallographic orientations of BDD grains and at the grain boundaries due to modification of surface termination in some cases followed by material decomposition.

These and similar results were part of the studies described within the manuscript in Materials journal (10.3390/ma13040964) and in Ultramicroscopy journal (10.1016/j.ultramic.2019.01.004)

Dataset file

Dataset_BDD.mdt
2.3 MB, S3 ETag be8e7bf77f8122f9a15ebfe87140ad61-1, downloads: 16
The file hash is calculated from the formula
hexmd5(md5(part1)+md5(part2)+...)-{parts_count} where a single part of the file is 512 MB in size.

Example script for calculation:
https://github.com/antespi/s3md5

File details

License:
Creative Commons: by-nc-sa 4.0 open in new tab
CC BY-NC-SA
Non-commercial - Share-alike
Raw data:
Data contained in dataset was not processed.
Software:
Gwyddion

Details

Year of publication:
2020
Verification date:
2020-12-17
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
  • chemical sciences (Natural sciences)
  • Automation, electronic and electrical engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/bv83-5017 open in new tab
Funding:
Series:
Verified by:
Gdańsk University of Technology

Keywords

References

Cite as

Authors

seen 88 times