Description
Thickness profile of thin diamond layers on glass. Results obtained using the Dektak XT device (Bruker). They present a layer thickness profile. allowing to determine the surface roughness and the thickness of the fusion diamond thin layer.
Dataset file
profilometer date.zip
1.5 MB,
S3 ETag
1440e4b7ae0ceab7343df66ac0922dd8-1,
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File details
- License:
-
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CC BYAttribution
Details
- Year of publication:
- 2024
- Verification date:
- 2025-03-13
- Dataset language:
- English
- Fields of science:
-
- materials engineering (Engineering and Technology)
- DOI:
- DOI ID 10.34808/khgc-6b60 open in new tab
- Funding:
- Verified by:
- Gdańsk University of Technology
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