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Description
The scanning tunneling microscope [1] is a powerful research tool that allows, among other things, to obtain images with atomic resolution. A serious limitation of the described microscope is its limited applicability relating to conductive and semiconductor materials and the reproducibility of measurements depending on the preparation of the measuring probe. In the case of the discussed technique, the probe preparation process is carried out by the operator, which may lead to low repeatability of the results. The file presents the results of imaging a structure composed of periodically arranged conical structures 3 µm apart. The sample was covered with a layer of sputtered gold to ensure conductivity and then scanned using several probes prepared in the same electrochemical process. There are quite significant differences that indicate the need for careful preparation of measuring elements used in tunnel microscopy.
[1] J. Tersoff, D.R. Hamann, Theory of scanning tunneling microscope, Phys. Rev. B. 31 (1985) 805–813
Dataset file
hexmd5(md5(part1)+md5(part2)+...)-{parts_count} where a single part of the file is 512 MB in size.Example script for calculation:
https://github.com/antespi/s3md5
File details
- License:
-
open in new tab
CC BY-NCNon-commercial - Raw data:
- Data contained in dataset was not processed.
- Software:
- Gwyddion
Details
- Year of publication:
- 2021
- Verification date:
- 2021-05-28
- Dataset language:
- English
- Fields of science:
-
- chemical sciences (Natural sciences)
- DOI:
- DOI ID 10.34808/eds0-ka26 open in new tab
- Series:
- Verified by:
- Gdańsk University of Technology
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