XRD data of (Cr,Fe,Mn,Co,Ni)3O4 High-entropy spinel oxide thin films deposited on amorphous SiO2 substrate by spray pyrolysis techniqe, annealed in a range from 400 to 900oC - Open Research Data - Bridge of Knowledge

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XRD data of (Cr,Fe,Mn,Co,Ni)3O4 High-entropy spinel oxide thin films deposited on amorphous SiO2 substrate by spray pyrolysis techniqe, annealed in a range from 400 to 900oC

Description

Dataset include collected XRD data of (Cr,Fe,Mn,Co,Ni)3O4 high-entropy spinel oxide thin films deposited by spray pyrolysis technique on amorphous SiO2 substrates and annealed from 400 to 900oC. Samples were prepared in the form of a ~ 500 nm thin film utilising a facile spray pyrolysis technique. The structural and electrical properties of the layers were
characterised after exposure to temperatures in the range of 400–900 ◦C. The as-deposited layers were amorphous, and crystallised upon heat treatment at 500 ◦C. Microstructural analyses proved a homogeneous elemental distribution and the desired Fd-3 m cubic spinel structure.

Dataset file

HEO-(Cr,Fe,Mn,Co,Ni)_XRD up to 900oC.xls
1.6 MB, S3 ETag 575b88d8018ddb7ad00b2a9631f0b8c7-1, downloads: 12
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File details

License:
Creative Commons: by-nc-nd 4.0 open in new tab
CC BY-NC-ND
Non-commercial - No Derivative Works
Raw data:
Data contained in dataset was not processed.

Details

Year of publication:
2023
Verification date:
2023-08-04
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID https://doi.org/10.1016/j.matchar.2023.113097 open in new tab
Funding:
Series:
Verified by:
Gdańsk University of Technology

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