XRD file presenting phase purity of the SiC wick material

Description

A file presents X-ray diffraction (XRD) analysis in the 10–90° range to verify the phase purity of the wick material. The measurements were performed on the exposed surface of the cylindrical sample. The XRD diffractogram of the SiC sample was measured in an air atmosphere.

Dataset file

XRD.pptx

6.6 MB, S3 ETag 2c1e12db1abaee19d3093b0fee8d5eb1-1, downloads: 0

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CC BY

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Details

Year of publication:

2025

Verification date:

2025-02-05

Creation date:

2025

Dataset language:

English

Fields of science:

materials engineering (Engineering and Technology)
mechanical engineering (Engineering and Technology)

DOI:

10.34808/0szf-5w74

Funding:

Theoretical and experimental investigations of Loop Heat Pipes with flat evaporator operating in elevated values of reduced temperatures.

Verified by:

Gdańsk University of Technology

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