Year 2017

• High resolution X-ray diffractometry and reflectometry of semiconductor nano- and micro- structures based on X-ray refractive optics

  Publication

  • P. Ershov

  - Year 2017

  In this thesis proposed, discussed and studied novel synchrotron X-ray diffractometry and reflectometry methods based on a refractive optics. The experimental results obtained from the ID06 beamline at ESRF, Grenoble, France are presented and analyzed in this work to demonstrate a high angular and space resolution in addition to the opportunity to manage in situ and on operando experiments with the help of proposed X-ray optical...

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Year 2015

• Highly porous nanoberyllium for X-ray beam speckle suppression

  Publication

  • A. Goikhman
  • I. Lyatun
  • P. Ershov
  • I. Snigireva
  • P. Wojda
  • V. Gorlevsky
  • A. Semenov
  • M. Sheverdyaev
  • V. Koletskiy
  • A. Snigirev

  - JOURNAL OF SYNCHROTRON RADIATION - Year 2015

  The speckle suppressor device containing highly porous nanoberyllium is proposed for manipulating with the spatial coherence length and removing undesirable speckle structure during the imaging experiments. We report a special device called the speckle suppressor, which contains the highly porous nanoberyllium plate, compacted from both sides by two beryllium windows. By insertion the speckle suppressor in the X-ray beam it allows...

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