Details
- Financial Program Name:
- OPUS
- Organization:
- Narodowe Centrum Nauki (NCN) (National Science Centre)
- Agreement:
- UMO-2014/15/B/ST4/04957 z dnia 2015-09-30
- Realisation period:
- 2015-09-30 - 2019-06-29
- Research team leader:
- prof. dr hab. inż. Janusz Smulko
- Realised in:
- Department of Metrology and Optoelectronics
- External institutions
participating in project: -
- Politechnika Poznańska (Poland)
- Project's value:
- 1 648 040.00 PLN
- Request type:
- National Research Programmes
- Domestic:
- Domestic project
- Verified by:
- Gdańsk University of Technology
Papers associated with that project
Filters
total: 7
Catalog Projects
Year 2020
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Ocena jakości superkondensatorów wybranymi metodami, wykorzystując zjawiska losowe i badania rozkładu temperatury
PublicationW artykule przedstawiono metody analizy jakości wykonania próbek superkondensatorów na podstawie pomiarów szumów generowanych w ich strukturach oraz rozkładów temperatury na ich powierzchni. Prezentowane metody zostały porównane z obecnie stosowanymi parametrami oceny jakości tych elementów. Wyniki uzasadniają wprowadzenie dodatkowych parametrów, pozwalających oceniać jakość superkondensatorów.
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Temperature distribution of supercapacitors prepared by various technologies
PublicationSupercapacitors, also known by different names such as electrostatic double-layer capacitors (EDLCs) or ultra-capacitors, are electrical storage devices still in development. These devices require fast and reliable methods of assessing their state-of-health. Thermographic imaging is a method which can be applied with this aim due to its popularity, and the high negative impact of overheating on a supercapacitor’s parameters. Moreover,...
Year 2019
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Effects of mechanical stress on electrical arameters and noise of supercapacitors
PublicationResults of noise and electrical parameters measurements of prototype electrochemical double layer capacitors (EDLC) are reported at the presence of selected mechanical stress. This issue is of great importance due to future applications in wearable technology. The measurement results are compared, and we may conclude than flicker noise is more sensitive to any stress than other considered electrical parameters.
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Methods of Assessing Degradation of Supercapacitors by Using Various Measurement Techniques
PublicationThis article presents the qualitative analyses of the construction of supercapacitor samples. The analyses are based on the suggested thermographic measurements as well as the technique of testing the inherent noise of the investigated element. The indicated assessment methods have been referred to the currently used parameters for the qualitative evaluation of supercapacitors. The approach described in this paper, which introduces...
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Methods of trend removal in electrochemical noise data – overview
PublicationIn this paper we shall review popular methods of trend removal from electrochemical noise time records. The basic principles of operation of the six most popular methods are explained. The proposed methods are: high - pass filtering, Moving Average Removal, polynomial detrending, wavelet detrending, Empirical Mode Decomposition and Variational Mode Decomposition. Estimation of trend removal quality...
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Noise in electrical double-layer capacitors (EDLCs)
PublicationWe present methods and problems of noise measurements in electrical double-layer capacitors (EDLC). Detailed noise equivalent electronic circuit is considered, and two possible ways of observations of random processes generated in the EDLCs structures are studied. We conclude that noise is a useful tool for characterization of the EDLC structures and their state-of-health, as in other materials and electronic devices. Eventual,...
Year 2018
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Low cost set-up for supercapacitors parameters evaluation
PublicationSupercapacitors are capable to store relatively high amount of energy comparing to its mass. Growing number of these devices applications requires development of new testing methods. Standard methods of evaluation of supercapacitor parameters, as cycling voltammetry, CV, galvanostatic cycling with potential limitation, GCPL, impedance measurements, require equipment of high cost...
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