Advanced polarization sensitive analysis in optical coherence tomography - Publication - Bridge of Knowledge

Search

Advanced polarization sensitive analysis in optical coherence tomography

Abstract

The optical coherence tomography (OCT) is an optical imaging method, which is widely applied in variety applications. This technology is used to cross-sectional or surface imaging with high resolution in non-contact and non-destructive way. OCT is very useful in medical applications like ophthalmology, dermatology or dentistry, as well as beyond biomedical fields like stress mapping in polymers or protective coatings defects detection. Standard OCT imaging is based on intensity images which can visualize the inner structure of scattering devices. However, there is a number of extensions improving the OCT measurement abilities. The main of them are the polarization sensitive OCT (PS-OCT), Doppler enable OCT (D-OCT) or spectroscopic OCT (S-OCT). Our research activities have been focused on PS-OCT systems. The polarization sensitive analysis delivers an useful information about optical anisotropic properties of the evaluated sample. This kind of measurements is very important for inner stress monitoring or e.g. tissue recognition. Based on our research results and knowledge the standard PS-OCT provide only data about birefringence of the measured sample. However, based on the OCT measurements more information including depolarization and diattenuation might be obtained. In our work, the method based on Jones formalism are going to be presented. It is used to determine birefringence, dichroism and optic axis orientation of the tested sample. In this contribution the setup of the optical system, as well as tests results verifying the measurements abilities of the system are going to be presented. The brief discussion about the effectiveness and usefulness of this approach will be carried out.

Citations

  • 0

    CrossRef

  • 0

    Web of Science

  • 0

    Scopus

Cite as

Full text

full text is not available in portal

Keywords

Details

Category:
Conference activity
Type:
materiały konferencyjne indeksowane w Web of Science
Title of issue:
Applied Optical Metrology II strony 1 - 7
Language:
English
Publication year:
2017
Bibliographic description:
Wieloszyńska A., Strąkowski M..: Advanced polarization sensitive analysis in optical coherence tomography, W: Applied Optical Metrology II, 2017, SPIE - The International Society for Optics and Photonics,.
DOI:
Digital Object Identifier (open in new tab) 10.1117/12.2273962
Verified by:
Gdańsk University of Technology

seen 122 times

Recommended for you

Meta Tags