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Application of dynamic impedance spectroscopy to atomic force microscopy

Abstract

Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface.

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Category:
Articles
Type:
artykuł w czasopiśmie wyróżnionym w JCR
Published in:
SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS no. 9, pages 1 - 10,
ISSN: 1468-6996
Language:
English
Publication year:
2008
Bibliographic description:
Darowicki K., Zieliński A., Kurzydłowski J.: Application of dynamic impedance spectroscopy to atomic force microscopy// SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS. -Vol. 9, nr. 4 (2008), s.1-10
Verified by:
Gdańsk University of Technology

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