Search
Abstract
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface.
Authors (3)
-
Jan Krzysztof Kurzydłowski
- Politechnika Warszawska Wydział Inżynierii Materiałowej
Cite as
Full text
download paper
downloaded 0 times
- Publication version
- Accepted or Published Version
- License
-
open in new tab
Keywords
Details
- Category:
- Articles
- Type:
- artykuł w czasopiśmie wyróżnionym w JCR
- Published in:
-
SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS
no. 9,
pages 1 - 10,
ISSN: 1468-6996 - Language:
- English
- Publication year:
- 2008
- Bibliographic description:
- Darowicki K., Zieliński A., Kurzydłowski J.: Application of dynamic impedance spectroscopy to atomic force microscopy// SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS. -Vol. 9, nr. 4 (2008), s.1-10
- Verified by:
- Gdańsk University of Technology
seen 22 times