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Abstract
Dynamic impedance spectroscopy, designed for measuring nonstationary systems, was used in combination with scanning probe microscopy. Using this approach, impedance mapping could be carried-out simultaneously with topography scanning. Therefore, correlation of electrical properties with particular phases of an examined sample was possible. The sample used in this study was spheroidal graphite cast iron with clearly defined phases having significantly different properties. Additionally, impedance-force curves were made at graphite precipitation and ferrite matrix to illustrate the relation between impedance and the force applied to a probe.
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- Category:
- Articles
- Type:
- artykuł w czasopiśmie wyróżnionym w JCR
- Published in:
-
MICROSCOPY AND MICROANALYSIS
no. 20,
edition 2,
pages 582 - 585,
ISSN: 1431-9276 - Language:
- English
- Publication year:
- 2014
- Bibliographic description:
- Tobiszewski M., Arutunow A., Darowicki K.: Application of dynamic impedance spectroscopy to scanning probe microscopy.// MICROSCOPY AND MICROANALYSIS. -Vol. 20, iss. 2 (2014), s.582-585
- Verified by:
- Gdańsk University of Technology
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