Atomic force microscopy based approach to local impedance measurements of grain interiors and grain boundaries of sensitized AISI 304 stainless steel - Publication - Bridge of Knowledge

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Atomic force microscopy based approach to local impedance measurements of grain interiors and grain boundaries of sensitized AISI 304 stainless steel

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Category:
Magazine publication
Type:
Magazine publication
Published in:
ELECTROCHIMICA ACTA no. 56, edition 5, pages 2372 - 2377,
ISSN: 0013-4686
ISSN:
0013-4686
Publication year:
2011
DOI:
Digital Object Identifier (open in new tab) 10.1016/j.electacta.2010.11.079
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