Atomic force microscopy based approach to local impedance measurements of grain interiors and grain boundaries of sensitized AISI 304 stainless steel - Publication - Bridge of Knowledge

Atomic force microscopy based approach to local impedance measurements of grain interiors and grain boundaries of sensitized AISI 304 stainless steel

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Authors (5)

A. Arutunow
K. Darowicki
A. Zieliński
Artur Zieliński
Kazimierz Darowicki

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Details

Category:: Magazine publication
Type:: Magazine publication
Published in:: ELECTROCHIMICA ACTA no. 56, edition 5, pages 2372 - 2377,
ISSN: 0013-4686
ISSN:: 0013-4686
Publication year:: 2011
DOI:: Digital Object Identifier (open in new tab) 10.1016/j.electacta.2010.11.079
Verified by:: No verification

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