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Abstract
Nanoimpedance measurements, using the dynamic impedance spectroscopy technique, were carried out during loading and unloading force of a probe on three kinds of materials of different resistivity. These materials were: gold, boron-doped diamond, and AISI 304 stainless steel. Changes of impedance spectra versus applied force were registered and differences in the tip-to-sample contact character on each material were revealed. To enable comparison between materials and phases, a new standardization method is proposed, which simulates conditions of initial contact.
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- Category:
- Articles
- Type:
- artykuł w czasopiśmie wyróżnionym w JCR
- Published in:
-
MICROSCOPY AND MICROANALYSIS
no. 20,
edition 1,
pages 72 - 77,
ISSN: 1431-9276 - Language:
- English
- Publication year:
- 2014
- Bibliographic description:
- Tobiszewski M., Zieliński A., Darowicki K.: Dynamic Nanoimpedance Characterization of the Atomic Force Microscope Tip-Surface Contact// MICROSCOPY AND MICROANALYSIS. -Vol. 20, iss. 1 (2014), s.72-77
- DOI:
- Digital Object Identifier (open in new tab) 10.1017/s1431927613013895
- Verified by:
- Gdańsk University of Technology
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