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Effect of the let-through energy of overcurrent protective devices on the temperature of conductors during short-circuits
Abstract
The scope of the verification of low-voltage systems covers the earth fault loop impedance measurement. This measurement is usually performed with the use of low-value current meters, which force a current many times lower than the one occurring during a real short-circuit. Therefore, the international standard recommends consideration of the increase of resistance of conductors with the increase of temperature, which may occur during short-circuits. This paper analyses the temperature rise of the conductors during short-circuits, taking into account the let-through energy of protection devices. The analysis has shown that in typical circuits the temperature rise of conductors is not significant.
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- Accepted or Published Version
- DOI:
- Digital Object Identifier (open in new tab) 10.15199/48.2021.08.05
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- Category:
- Articles
- Type:
- artykuły w czasopismach
- Published in:
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Przegląd Elektrotechniczny
pages 27 - 30,
ISSN: 0033-2097 - Language:
- English
- Publication year:
- 2021
- Bibliographic description:
- Czapp S., Kowalak D.: Effect of the let-through energy of overcurrent protective devices on the temperature of conductors during short-circuits// Przegląd Elektrotechniczny -Vol. 97,iss. 8 (2021), s.27-30
- DOI:
- Digital Object Identifier (open in new tab) 10.15199/48.2021.08.05
- Verified by:
- Gdańsk University of Technology
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