Search
Abstract
The paper presents detailed model of noise sources in supercapacitors. Noise phenomena observed in supercapacitors may be used as a diagnostic tool for assessment of supercapacitor quality or degradation mechanisms (e.g. corrosion of the electrodes or cloggin g up the pores) during ageing. Therefore, it is important to consider where noise is generated. The equivalent circuit of noise sources existing in supercapacitor is proposed. Methods of noise sources identification are also considered . Limitations of the proposed model are underlined . Final conclusions show a path of further investigations of random phenomena in supercapacitors.
Citations
-
0
CrossRef
-
0
Web of Science
-
0
Scopus
Cite as
Full text
- Publication version
- Accepted or Published Version
- DOI:
- Digital Object Identifier (open in new tab) 10.1088/1742-6596/1065/10/102004
- License
-
open in new tab
Keywords
Details
- Category:
- Articles
- Type:
- publikacja w in. zagranicznym czasopiśmie naukowym (tylko język obcy)
- Published in:
-
Journal of Physics : Conference Series
no. 1065,
pages 1 - 5,
ISSN: 1742-6588 - Language:
- English
- Publication year:
- 2018
- Bibliographic description:
- Lentka Ł.. Model of noise sources in supercapacitors. Journal of Physics : Conference Series, 2018, Vol. 1065, , s.1-5
- DOI:
- Digital Object Identifier (open in new tab) 10.1088/1742-6596/1065/10/102004
- Verified by:
- Gdańsk University of Technology
seen 118 times
Recommended for you
Measurements of flicker noise in supercapacitor cells
- A. Szewczyk,
- Ł. Lentka,
- J. Smulko
- + 2 authors