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Rapid Yield Estimation and Optimization of Microwave Structures Exploiting Feature-Based Statistical Analysis

Abstract

In this paper, we propose a simple, yet reliable methodology to expediteyield estimation and optimization of microwave structures. In our approach,the analysis of the entire response of the structure at hand (e.g., $S$-parameters asa function of frequency) is replaced by response surface modeling of suitablyselected feature points. On the one hand, this is sufficient to determinewhether a design satisfies given performance specifications. On the other,by exploiting the almost linear dependence of the feature points on the designableparameters of the structure, reliable yield estimates can be realized at lowcomputational cost. Our methodology is verified using two examples of waveguidefilters and one microstrip hairpin filter and compared with conventional MonteCarlo analysis based on repetitive electromagnetic simulations, as well aswith statistical analysis exploiting linear response expansions around thenominal design. Finally, we perform yield-driven design optimizations on thesefilters.

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Accepted or Published Version
DOI:
Digital Object Identifier (open in new tab) 10.1109/TMTT.2014.2373365
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Copyright (2014 IEEE)

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Category:
Articles
Type:
artykuł w czasopiśmie wyróżnionym w JCR
Published in:
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES no. 63, edition 1, pages 107 - 114,
ISSN: 0018-9480
Language:
English
Publication year:
2015
Bibliographic description:
Kozieł S., Bandler J.: Rapid Yield Estimation and Optimization of Microwave Structures Exploiting Feature-Based Statistical Analysis// IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. -Vol. 63, iss. 1 (2015), s.107-114
DOI:
Digital Object Identifier (open in new tab) 10.1109/tmtt.2014.2373365
Verified by:
Gdańsk University of Technology

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