SEI Growth and Depth Profiling on ZFO Electrodes by Soft X-Ray Absorption Spectroscopy - Publication - Bridge of Knowledge

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SEI Growth and Depth Profiling on ZFO Electrodes by Soft X-Ray Absorption Spectroscopy

Abstract

ZnFe2O4 (ZFO) Li-ion batteries (LIBs) represent a reliable, affordable, and safe energy storage technology for use in portable application. However, current LIB active materials (graphite, lithium/transition metal spinel or layered oxides, olivine structures) can store only limited energy since they rely on insertion storage based on solid-state host-guest interactions. Moreover, performances and durability of the cells are strongly influenced by the characteristics of the solid electrolyte interphase (SEI), which is formed upon the electrodes, especially for graphite, during the first charge/discharge cycle. This process is difficult to study and control. The aim of this work is to study the evolution of the SEI in this innovative anode material at selected charging steps by exploiting the surface sensitivity of the soft X-ray absorption spectroscopy (XAS). This technique requires synchrotron radiation and was never used before for such a purpose, although it appears to be very suitable for a detailed depth profiling of the SEI of advanced electrodes. The main conclusions that can be drawn by this work can be summarized as follows: 1) the evolution of the SEI takes place already during the first steps of the charging process and its thickness reach about 40 nm at about 1/3 of the full capacity, with a stable total thickness up to 20 working cycles; 2) the XAS technique is found to be very effective providing an estimate of the local thickness of the SEI, and indicates that the SEI grows preferentially around the ZFO nanoparticles.

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Authors (10)

  • Photo of prof. Andrea DiCicco

    Andrea DiCicco prof.

    • School of Science and Technology, University of Camerino, Camerino, Italy Physics Division
  • Photo of  Angelo Giglia

    Angelo Giglia

    • CNR, Trieste, Italy Istituto Officina Materiali
  • Photo of  Roberto Gunnella

    Roberto Gunnella

    • School of Science and Technology, University of Camerino, Camerino, Italy Physics Division
  • Photo of  Stephan Koch

    Stephan Koch

    • Helmholtz Institute Ulm, Ulm , Germany Electrochemistry for Batteries
  • Photo of  Franziska Mueller

    Franziska Mueller

    • Helmholtz Institute Ulm, Ulm , Germany Electrochemistry for Batteries
  • Photo of  Francesco Nobili

    Francesco Nobili

    • School of Science and Technology, University of Camerino, Camerino, Italy Chemistry Division
  • Photo of  Marta Pasqualini

    Marta Pasqualini

    • School of Science and Technology, University of Camerino, Camerino, Italy Chemistry Division
  • Photo of  Stefano Passerini

    Stefano Passerini

    • Helmholtz Institute Ulm, Ulm , Germany Electrochemistry for Batteries
  • Photo of  Roberto Tossici

    Roberto Tossici

    • School of Science and Technology, University of Camerino, Camerino, Italy Chemistry Division

Keywords

Details

Category:
Articles
Type:
artykuł w czasopiśmie wyróżnionym w JCR
Published in:
Advanced Energy Materials no. 5, edition 18, pages 1 - 6,
ISSN: 1614-6832
Language:
English
Publication year:
2015
Bibliographic description:
Dicicco A., Giglia A., Gunnella R., Koch S., Mueller F., Nobili F., Pasqualini M., Passerini S., Tossici R., Witkowska A.: SEI Growth and Depth Profiling on ZFO Electrodes by Soft X-Ray Absorption Spectroscopy// Advanced Energy Materials. -Vol. 5, iss. 18 (2015), s.1-6
DOI:
Digital Object Identifier (open in new tab) 10.1002/aenm.201500642
Verified by:
Gdańsk University of Technology

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