Search results for: x-ray diffractometry

• High resolution X-ray diffractometry and reflectometry of semiconductor nano- and micro- structures based on X-ray refractive optics

  Publication

  • P. Ershov

  - Year 2017

  In this thesis proposed, discussed and studied novel synchrotron X-ray diffractometry and reflectometry methods based on a refractive optics. The experimental results obtained from the ID06 beamline at ESRF, Grenoble, France are presented and analyzed in this work to demonstrate a high angular and space resolution in addition to the opportunity to manage in situ and on operando experiments with the help of proposed X-ray optical...

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• X-ray diffractometry results of the Sr0.86Ti0.65Fe0.35O3 powder

  Open Research Data

  open access

  • A. Mroziński
  • T. Miruszewski

  - series: Electrochemical properties of porous Sr0.86Ti0.65Fe0.35O3 oxygen electrodes

  This dataset contains results of X-ray diffractometry mesurement (XRD) of the Sr0.86Ti0.65Fe0.35O3-d (STF35) powder. The phase composition of the investigated STF35 powder was analyzed by XRD at room temperature. It confirms the formation of the cubic perovskite oxide phase. Calculated average lattice constant is a  3.90882(1) Å, with Goodness of Fit...

• X-ray diffractometry results of the SrTi0.50Fe0.50O3-d powder

  Open Research Data

  open access

  • A. Mroziński
  • B. Kamecki

  - series: Effect of sintering temperature on electrochemical performance of porous SrTi1-xFexO3-δ oxygen electrodes

  This dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.50Fe0.50O3-d (STF50) powder after ball milling. The phase composition of the investigated STF50 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...

• X-ray diffractometry results of the SrTi0.35Fe0.65O3-d powder

  Open Research Data

  open access

  • A. Mroziński
  • B. Kamecki

  - series: Effect of sintering temperature on electrochemical performance of porous SrTi1-xFexO3-δ oxygen electrodes

  This dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.35Fe0.65O3-d (STF35) powder after ball milling. The phase composition of the investigated STF35 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...

• X-ray diffractometry results of the SrTi0.30Fe0.70O3-d powder

  Open Research Data

  open access

  • A. Mroziński
  • B. Kamecki

  - series: Effect of sintering temperature on electrochemical performance of porous SrTi1-xFexO3-δ oxygen electrodes

  This dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.30Fe0.70O3-d (STF70) powder after ball milling. The phase composition of the investigated STF70 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...

• X-RAY SPECTROMETRY

  Journals

  ISSN: 0049-8246 , eISSN: 1097-4539

• Study of the Layer-Type BST Thin Film with X-ray Diffraction and X-ray Photoelectron Spectroscopy

  Publication

  • A. Lisińska-Czekaj
  • D. Czekaj

  - Materials - Year 2022

  In the present paper, results of X-ray photoelectron studies of electroceramic thin films of barium strontium titanate, Ba1xSrxTiO3 (BST), composition deposited on stainless-steel substrates are presented. The thin films were prepared by the sol-gel method. A spin-coating deposition of BST layers with different chemical compositions was utilized so the layer-type structure of (0-2) connectivity was formed. After the deposition,...

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• Modeling of the M X-ray line structures for tungsten and L X-ray line structures for molybdenum

  Publication

  • K. Słabkowska
  • M. Polasik
  • Ł. Syrocki
  • E. Szymańska
  • J. Rzadkiewicz
  • N. Pereira
  • Ł. Syrocki

  - Journal of Physics: Conference Series - Year 2015

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• X-ray absorption fine structure and x-ray diffraction studies of crystallographic grains in nanocrystalline FePd:Cu thin films

  Publication

  • M. Krupinski
  • M. Perzanowski
  • A. Polit
  • Y. Zabila
  • A. Zarzycki
  • A. Dobrowolska
  • M. Marszalek

  - JOURNAL OF APPLIED PHYSICS - Year 2011

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• X-Ray Structure Analysis Online

  Journals

  ISSN: 1883-3578