prof. dr hab. inż. Wojciech Sadowski
Zatrudnienie
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Structural and luminescence properties of B2O3-Bi2O3+10AlF3 glasses doped with Eu3+/Dy3+ ions
Dane BadawczeThe attached data contains the results of measurements of B2O3-Bi2O3 and B2O3-Bi2O3+10AlF3 glasses doped with Eu3+ and Dy3+ ions in different molar ratios. Glasses were synthesized by the melt quenching technique. On their basis, the structural, optical, and luminescence properties of synthesized samples were characterized. The dataset includes XRD,...
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Influence of controlled crystallization and SrF2 content on the structure and properties of Eu3+ doped phosphate glasses
Dane BadawczeThe attached data contains the results of measurements of phosphate glasses and glass-ceramics doped with Eu. On their basis, the new material was characterized and the influence of the SrF2 addition on the glass structure was determined. In addition, the influence of the SrF2 content and controlled crystallization on the luminescent properties of Eu3+...
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Au nanostructures coated with a ultrathin film of Al2O3 - measurements and FDTD simulations
Dane BadawczeGold plasmonic platforms have been coated with an ultra-thin films of aluminium oxide. Optical measurements, showing the influence of the thickness of Al2O3 on plasmon resonance position. The observed red-shift of the resonance location with the increase of the thickness of the Al2O3 film, can be explained by the change in the dielectric function of...
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XRD, DTA and luminescence measurements of B2O3-Bi2O3-AlF3 glasses doped with Eu3+, Tb3+ and Tm3+ ions
Dane BadawczeThe DataSet contains the XRD,DTA and luminescence measurements for the B2O3-Bi2O3-AlF3 glass system. Samples were prepared by the conventional melt quenching technique. Starting materials were melted in porcelain crucibles at 950 oC for 20 min. XRD and DTA data were collected for 50B2O3-50Bi2O3,45B2O3-45Bi2O3+10AlF3 and 40B2O3-40Bi2O3+20AlF3 glasses....
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Luminescence and FTIR measurements of B2O3-Bi2O3-SrF2 glass and glass-ceramics doped with Eu3+ ions
Dane BadawczeLuminescence and FTIR measurements of B2O3-Bi2O3-xSrF2+2Eu (x=10,20) glass and glass-ceramics. The emission and excitation spectra of the samples depend on the composition and annealing time.
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Raw data of AuAg nanoalloy plasmon resonances used for machine learning method
Dane BadawczeRaw data used for machine learning process. UV-vis measurements of AuAg alloyed nanostructures created from thin films. Plasmonic band position dependence on fabrication parameters. Small presentation reviewing achieved structures and their properties.
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Temperature of formation of Au nanostructures
Dane BadawczeNanostructures were obtained via annealing of thin Au films. In order to determine possible nanoislands formation mechanisms, dependence on initial film thickness was examined. For the surface morphology studies, nanograin structure and chemical composition analysis, SEM, HR TEM and EDS measurements were performed, respectively. Morphology studies shown...
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Structure and optical measurements of Eu doped tellurium oxide thin films
Dane BadawczeThin films were deposited by magnetron sputtering method and simultaneously heated at 200 oC. Presence of Eu ions and their valence states was confirmed by X-ray photoemission spectroscopy measurements. The structure of the films as well as the influence of europium dopant on crystalline structure of the films was examined by X-ray diffraction method. ...
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UV-Vis measurements and SEM images of Ag nanostructures
Dane BadawczeUv-vis and SEM of Ag nanostructures. Structures were obtained by dewetting thin films. Various fabrication conditions i.e. temperature, time of the annealing and thickness of the initial layer were subsequently changed.
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Measurements of AuAg nanostructures
Dane BadawczeExtensive UV-vis measurements of AuAg alloyed nanostructures created from thin films. Plasmonic band position dependence on fabrication parameters.
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Processed measurements of AuAg nanostructures
Dane BadawczeExtensive processed UV-vis measurements of AuAg alloyed nanostructures created from thin films. Plasmonic band position dependence on fabrication parameters.
wyświetlono 3875 razy