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Katalog Danych Badawczych
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XPS (X-ray photoelectron spectroscopy) survey spectra of CPMD and CPMH
Dane BadawczeXPS (X-ray photoelectron spectroscopy) survey spectra of CPMD and CPMH. XPS spectra were obtained using Al Kɑ (hv=1486.6 eV) radiation with a Prevac system equipped with a Scienta SES 2002 electron energy analyzer operating at constant transmission energy (Ep=50 eV). Sample abbreviations (CPMD, CPMH) are in agreement with the markings used in the linked...
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X-ray diffraction (XRD) of pristine bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Dane BadawczeData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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X-ray diffraction (XRD) of silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Dane BadawczeData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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XRD-TiO2 and SiO2
Dane BadawczeData contain results from XRD measurements of amorphous silica and TiO2 of antase and rutile phases. The commercial TiO2 named as P25 produced by Evonik was also analyzed.
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XRD-TiO2 heat-treated at 400-600oC in Ar or H2
Dane BadawczeThese data contain XRD patterns of TiO2 heat-treated at 400-600oC in Ar or H2. Two pases of TiO2 were identified: anatase and rutile.
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XPS-TiO2 heated in H2
Dane BadawczeThese XPS spectra were recorded for TiO2 heat-treated at 450-600oC in H2. Surface oxygen groups were determined. Deconvolution of Ti 2p peak allowed to determine Ti3+ on the titania surface.
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X-ray diffraction spectra of nitrogen-doped carbon in hybrid materials containing praseodymium oxide
Dane BadawczeX-ray powder diffraction patterns of samples were carried out by Philips X’Pert diffractometer, which was radiated by graphite monochromatized Cu Kα (l equal 1.540598). The operating voltage was maintained at 40 kV, the current was maintained at 30 mA and analyzed in the range from 20° to 90°. The data presented confirmed the presence of the PrBSCF...
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XRD data of (Cr,Fe,Mn,Co,Ni)3O4 High-entropy spinel oxide thin films deposited on amorphous SiO2 substrate by spray pyrolysis techniqe, annealed in a range from 400 to 900oC
Dane BadawczeDataset include collected XRD data of (Cr,Fe,Mn,Co,Ni)3O4 high-entropy spinel oxide thin films deposited by spray pyrolysis technique on amorphous SiO2 substrates and annealed from 400 to 900oC. Samples were prepared in the form of a ~ 500 nm thin film utilising a facile spray pyrolysis technique. The structural and electrical properties of the layers...
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XRD and electrochemical results for MoO3 films deposited using pulsed laser deposition system
Dane BadawczeThe attached data contains XRD and electrochemical results for MoO3 films deposited on fluorine-doped tin oxide glasses. Films were deposited using a pulsed laser deposition system at different conditions. Part of the samples was deposited at room temperature and then annealed at 575°C for given times (samples labeled PLD_RT_575C_xmin, where x stands...
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X-ray diffraction of ZnIn2S4 layers on TiO2NT and FTO annealed at different temperatures
Dane BadawczeData show XRD results for ZnIn2S4 layers deposited using hydrothermal method on FTO glass and TiO2 nanotubes. The layers were annealed in air atmosphere at 300, 400 and 500 oC.
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X-ray diffraction patterns of BaCe0.6Zr0.2Y0.1M0.1O3-δ (M = Fe, Pr, Tb)
Dane BadawczeThe dataset consists of three raw X-ray diffraction (XRD) files collected using a Phillips X’Pert Pro diffractometer (CuKα radiation (𝜆 = 1.541 Å), under 40 kV and 30 mA). The diffraction patterns of BaCe0.6Zr0.2Y0.1Fe0.1O3-δ (BCZYFe), BaCe0.6Zr0.2Y0.1Pr0.1O3-δ (BCZYPr), and BaCe0.6Zr0.2Y0.1Tb0.1O3-δ (BCZYTb) were collected at room temperature. Collected...
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X-ray diffraction spectra of modification of TiO2 nanotubes by graphene - strontium and cobalt molybdate perovskite
Dane BadawczeData show XRD results for strontium and cobalt molybdate-modified nanotubes that were also decorated with graphene oxide. The crystalline phases were characterized by X-ray diffractometer (Philips X”Pert with detector X’Celerator Scientific).
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XRD, DTA and luminescence measurements of B2O3-Bi2O3-AlF3 glasses doped with Eu3+, Tb3+ and Tm3+ ions
Dane BadawczeThe DataSet contains the XRD,DTA and luminescence measurements for the B2O3-Bi2O3-AlF3 glass system. Samples were prepared by the conventional melt quenching technique. Starting materials were melted in porcelain crucibles at 950 oC for 20 min. XRD and DTA data were collected for 50B2O3-50Bi2O3,45B2O3-45Bi2O3+10AlF3 and 40B2O3-40Bi2O3+20AlF3 glasses....
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XRD pattern of Mo2Ga2C, Mo2CTx/Mo2GaC and Ni-Mo2CTx/Mo2Ga2C materials
Dane BadawczeIn the dataset are included raw data for the preparation of XRD pattern of Mo2Ga2C, Mo2CTx/Mo2GaC and Ni-Mo2CTx/Mo2Ga2C materials.
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XRD results of melamine sponges impregnated by DES
Dane BadawczeThe set includes raw data from XRD analysis of pure melamine sponge and melamine sponges impregnated by:- Eucalyptol:Menthol (1:1)- Eucalyptol:Menthol (1:2)- Eucalyptol:Menthol (1:3)- Eucalyptol:Menthol (1:4)- Eucalyptol:Menthol (1:5)- Thymol:Menthol (1:1)
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XPS study of the lithium titanate doped by copper
Dane BadawczeLithium titanate doped by copper was measured by X-ray photoemission spectroscopy. For sol-gel synthesis lithium acetate dehydrate from Alfa Aesar GmbH &Co and titanium (IV) butoxide 97% from Aldrich were used as reagents. Copper (II) nitrate from Alfa Aesar was used as a source of Cu dopant. It was added in the proper weight to get an x index equal...
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XPS analysis of the GO based materials
Dane BadawczeGraphene oxides samples were measured by XPS method. The X-ray photoemission spectroscopy measurements were carried out with Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The photoelectrons...
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XRD patterns of nickel-modified V2CTx
Dane BadawczeThe set includes data for XRD pattern preparation of nickel-modified V2CTx samples.
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XRD patterns of TeOx powder
Dane BadawczeThe DataSet contains the XRD patterns of the TeOx powder. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. The sol was obtained by vigorously stirring precursor solution at 50°C for 2h, then the temperature was raised to 75°C for the...
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XRD patterns of TeOx-BaO-BiO powder
Dane BadawczeThe DataSet contains the XRD patterns of the TeOx-BaO-BiO powder. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor), barium carbonate, and bismuth carbonate with thetraetylene glycol, water, ethanol, and acetic acid. (Samples molar concentration: 73TeO2-4BaO-3Bi2O3 and 73TeO2-3BaO-4Bi2O3)....