A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors - Publikacja - MOST Wiedzy

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A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors

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In this paper, a gray-scale CMOS image sensor (CIS) characterization system with an optimization feature has been proposed. By using a very fast and precise control of light intensity, based on the pulsewidth-modulation method, it is avoided to measure the illuminance every time. These features accelerate the multicriteria CIS optimization requiring many thousands of measurements. The system throughput is 2.5 Gb/s, which allows for capturing images from large arrays of the size 3000 × 3000 pixels at the rate of 25 frames/s, or small arrays (128 × 128) at the rate of 15 000 frames/s. The efficient transfer of measurement data to the external software allows immediate presentation of optimization results in 3-D plots. The system automatically measures nonuniformity, spatial noise, temporal noise, signal-to-noise ratio, dynamic range, nonlinearity and image lag. A flat diffuser has been proposed as a cheaper alternative to an integrating sphere. This optical front-end is particularly useful for testing prototype CISs and vision-chips implemented in standard CMOS technologies as low- or ediumdynamic-range imagers.

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Miron Kłosowski, Jacek Jakusz, Waldemar Jendernalik, Grzegorz Blakiewicz, Stanisław Szczepański, Sławomir Kozieł. (2018). A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors, 67(10), 2363-2372. https://doi.org/10.1109/tim.2018.2814118

Informacje szczegółowe

Kategoria:
Publikacja w czasopiśmie
Typ:
artykuł w czasopiśmie wyróżnionym w JCR
Opublikowano w:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT nr 67, wydanie 10, strony 2363 - 2372,
ISSN: 0018-9456
Język:
angielski
Rok wydania:
2018
Opis bibliograficzny:
Kłosowski M., Jakusz J., Jendernalik W., Blakiewicz G., Szczepański S., Kozieł S.: A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors// IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. -Vol. 67, iss. 10 (2018), s.2363-2372

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