AFM-assisted investigation of conformal coatings in electronics - Publikacja - MOST Wiedzy


AFM-assisted investigation of conformal coatings in electronics


Purpose – This paper aims to presents a new method of investigation of local properties of conformal coatings utilized in microelectronics. Design/methodology/approach – It is based on atomic force microscopy (AFM) technique supplemented with the ability of local electrical measurements, which apart from topography acquisition allows recording of local impedance spectra, impedance imaging and dc current mapping. Potentialities of the proposed AFM-assisted approach have been demonstrated on commercially available epoxy-coated electronic printed boards in as-received state and after six-year service. Findings – The technique proved to be capable of identification, spatial localization and characterization of conformal coating defects. Practical implications – The proposed approach can be utilized for assessment of protective film state in such demanding fields as electronics or electrotechnics where the classical techniques of anticorrosion coatings investigation cannot be employed due to small element dimensions and relatively low coating thickness. Originality/value – The approach adopted by the author is novel in the field of organic coatings investigation.


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Publikacja w czasopiśmie
artykuł w czasopiśmie wyróżnionym w JCR
Opublikowano w:
ANTI-CORROSION METHODS AND MATERIALS nr 63, wydanie 4, strony 289 - 294,
ISSN: 0003-5599
Rok wydania:
Opis bibliograficzny:
Szociński M.: AFM-assisted investigation of conformal coatings in electronics// ANTI-CORROSION METHODS AND MATERIALS. -Vol. 63, iss. 4 (2016), s.289-294
Cyfrowy identyfikator dokumentu elektronicznego (otwiera się w nowej karcie) 10.1108/acmm-09-2014-1426
Politechnika Gdańska

wyświetlono 23 razy

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