Electronic and ionic relaxations in strontium-borate glass and glass-ceramics containing bismuth and vanadium oxides - Publikacja - MOST Wiedzy

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Electronic and ionic relaxations in strontium-borate glass and glass-ceramics containing bismuth and vanadium oxides

Abstrakt

The topography, microstructure and electrical properties of strontium-borate glass and SBO glass containing bismuth and vanadium oxides, were studied. The structure was measured using X-ray diffraction (XRD), Energy Dispersive X-ray Spectrometer (EDS) and Scanning electron microscope (SEM) methods. The A.C. complex conductivity was investigated as a function of temperature and frequency. The influence of the quantity of bismuth and vanadium oxides present, on glasses microstructure and electrical properties, was discussed. In order to obtain glass-ceramics, the glasses were subjected to crystallization at temperatures close to the exothermic processes indicated by the differential scanning calorimetry (DSC) measurements. X- ray diffraction (XRD) measurements were carried out to determine the presence of bismuth vanadate (Bi2VO5.5) crystalline phase in heat-treated samples. After heat-treatment, there were still some traces of the glassy phase within the samples. The effect of the crystallization process on the microstructure, topography and dielectric behavior of the material was analyzed. The A.C. dielectric permittivity, conductivity and impedance were discussed at specific temperature and frequency region, in addition conduction mechanisms were proposed.

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Informacje szczegółowe

Kategoria:
Publikacja w czasopiśmie
Typ:
artykuł w czasopiśmie wyróżnionym w JCR
Opublikowano w:
SOLID STATE IONICS nr 282, strony 37 - 48,
ISSN: 0167-2738
Język:
angielski
Rok wydania:
2015
Opis bibliograficzny:
Szreder N., Kupracz P., Prześniak-Welenc M., Karczewski J., Gazda M., Siuzdak K., Barczyński R.: Electronic and ionic relaxations in strontium-borate glass and glass-ceramics containing bismuth and vanadium oxides// SOLID STATE IONICS. -Vol. 282, (2015), s.37-48
DOI:
Cyfrowy identyfikator dokumentu elektronicznego (otwiera się w nowej karcie) 10.1016/j.ssi.2015.09.021
Weryfikacja:
Politechnika Gdańska

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