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Fault detection in electronic circuits using test buses


A survey of test buses designed for diagnostics of digital and analog electronic circuits is presented: the IEEE 1149.1 bus for digital circuits, the IEEE 1149.4 bus for mixed-signal and the IEEE 1149.6 bus for AC coupled complex digital circuits. Each bus is presented with its structure, solution of key elements, particularly boundary registers and a set of test instructions. Diagnosis with the use of the described buses is possible at the level of a single integrated circuit, board or system. Testing buses can be used not only at the production stage, but also later by the user; testing can be carried out also remotely through the Internet. A laboratory stand is presented for fault detection in analog electronic circuits, using the IEEE 1149.4 mixed signal test bus. Results are also presented of tests carried out with the use IEEE 1149.4 standard for testing and identification of faults in electronic circuits. The tests were carried out with the use of the SCANSTA400 circuit designed by National Semiconductor and Logic Vision. Test results of measurements of analog devices through the bus are presented together with the obtained accuracies. The advantages and deficiencies of the presented testing buses were discussed , perspectives of their practical application in testing and programming and debugging of embedded systems based on microcontrollers presented, as well as directions of their further development.

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Publikacja monograficzna
rozdział, artykuł w książce - dziele zbiorowym /podręczniku o zasięgu krajowym
Tytuł wydania:
Metrologia dziś i jutro : praca zbiorowa strony 349 - 358
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Opis bibliograficzny:
Bartosiński B.: Fault detection in electronic circuits using test buses // Metrologia dziś i jutro : praca zbiorowa/ ed. pod redakcją Wiesława Kicińskiego, Leona Swędrowskiego ; Politechnika Gdańska. Gdańsk: Katedra Metrologii i Systemów Informacyjnych, Wydział Elektrotechniki i Automatyki, Politechnika Gdańska, 2009, s.349-358
Politechnika Gdańska

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