Structure and thermoelectric properties of Te/Ag/Ge/Sb (TAGS) materials obtained by reduction of melted oxide substrates - Publikacja - MOST Wiedzy

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Structure and thermoelectric properties of Te/Ag/Ge/Sb (TAGS) materials obtained by reduction of melted oxide substrates

Abstrakt

The Ge0.77Ag0.1Sb0.13Te1alloy was fabricated by a novel two step route. For that purpose firstly the oxide reagents were melted at high temperature and quenched into pellets. After that pellets were milled to the powder and then reduced in hydrogen at various temperatures and for various periods of time. Energy dispersive X-ray analysis indicated the possibility of successful fabrication of stoichiometric thermoelectric materials from Te-Ag-Ge-Sb (TAGS) group. The electrical conductivity and Seebeck coefficient have been determined over temperature range from +20 °C up to +340 °C in argon atmosphere. It was also shown that for most of the fabricated samples the size of crystallites as well as electrical parameters like electrical conductivity, Seebeck coefficient and figure of merit (ZT) increases with the increasing time of reduction.The highest value of ZT (~1.0 at 340oC) was obtained for samples reduced in hydrogen atmosphere at 400oC for 20h and 40h.

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Kategoria:
Publikacja w czasopiśmie
Typ:
artykuł w czasopiśmie wyróżnionym w JCR
Opublikowano w:
JOURNAL OF ELECTRONIC MATERIALS nr 45, wydanie 2, strony 1085 - 1093,
ISSN: 0361-5235
Język:
angielski
Rok wydania:
2016
Opis bibliograficzny:
Kusz B., Miruszewski T., Bochentyn B., Łapiński M., Karczewski J.: Structure and thermoelectric properties of Te/Ag/Ge/Sb (TAGS) materials obtained by reduction of melted oxide substrates// JOURNAL OF ELECTRONIC MATERIALS. -Vol. 45, iss. 2 (2016), s.1085-1093
DOI:
Cyfrowy identyfikator dokumentu elektronicznego (otwiera się w nowej karcie) 10.1007/s11664-015-4251-1
Weryfikacja:
Politechnika Gdańska

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