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Wyniki wyszukiwania dla: ADC
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In-ADC, Rank-Order Filter for Digital Pixel Sensors
PublikacjaThis paper presents a new implementation of the rank-order filter, which is established on a parallel-operated array of single-slope (SS) analog-to-digital converters (ADCs). The SS ADCs use an “on-the-ramp processing” technique, i.e., filtration is performed along with analog-to-digital conversion, so the final states of the converters represent a filtered image. A proof-of-concept 64 × 64 array of SS ADCs, integrated with MOS...
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An Implementation of a Compact Smart Resistive Sensor Based on a Microcontroller with an Internal ADC
PublikacjaIn the paper a new implementation of a compact smart resistive sensor based on a microcontroller with internal ADCs is proposed and analysed. The solution is based only on a (already existing in the system) microcontroller and a simple sensor interface circuit working as a voltage divider consisting of a reference resistor and the resistive sensor connected in parallel with an interference suppression capacitor. The measurement...
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Single-Slope ADC With Embedded Convolution Filter for Global-Shutter CMOS Image Sensors
PublikacjaThis brief presents an analog-to-digital converter (ADC) suitable for acquisition and processing of images in the global-shutter mode at the pixel level. The ADC consists of an analog comparator, a multi-directional shift register for the comparator states, and a 16-bit reversible binary counter with programmable step size. It works in the traditional single-slope mode. The novelty is that during each step of the reference ramp,...
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A method of self-testing of an analog circuit terminated by an ADC in electronic embedded systems controlled by microcontrollers
PublikacjaA new self-testing method of analog parts terminated by an ADC in electronic embedded systems controlled by microcontrollers is presented. It is based on a new fault diagnosis method based on on-line (i.e. during measurement), transformations of voltage samples of the time response of a tested part to a square pulse - onto localization curves placed in the measurement space. The method can be used for fault detection and single...
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Hybrid‐mode single‐slope ADC with improved linearity and reduced conversion time for CMOS image sensors
PublikacjaIn the paper, a single‐slope analog‐to‐digital converter (ADC) for integrated CMOS image sensor applications with an improved technique of conversion has been proposed. The proposed hybrid‐mode ADC automatically uses one of the following conversion techniques: time based (i.e. PWM) or voltage based (i.e. single‐slope). During the ADC operation, the clock frequency and reference voltage are modified in order to reduce the conversion...
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A CMOS Pixel With Embedded ADC, Digital CDS and Gain Correction Capability for Massively Parallel Imaging Array
PublikacjaIn the paper, a CMOS pixel has been proposed for imaging arrays with massively parallel image acquisition and simultaneous compensation of dark signal nonuniformity (DSNU) as well as photoresponse nonuniformity (PRNU). In our solution the pixel contains all necessary functional blocks: a photosensor and an analog-to-digital converter (ADC) with built-in correlated double sampling (CDS) integrated together. It is implemented in...
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An integrated geoarchaeological approach to late Iron Age settlement at Kaštelina hillfort (Lopar, Island of Rab, Croatia) using Amplitude Data Comparison (ADC) method and trial excavation
PublikacjaGeophysical prospection and small-scale archaeological excavation were undertaken on the site of Kaštelina, a Late Iron Age hillfort settlement located on the Stolac promontory in the northern part of Rab island (Kvarner Gulf, Croatia). Within the frame of the “Archaeological topography of the island of Rab” program, a Polish–Croatian team applied a series of multidisciplinary methods to study the occupational history of the...
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Simple Measurement Method for Resistive Sensors Based on ADCs of Microcontrollers
PublikacjaA new, complete measurement method for resistance measurement of resistive sensors for systems based on microcontrollers equipped with analog-to-digital converters (ADCs) is proposed. The interface circuit consists of only four resistors, including a resistive sensor and a reference resistor, connected directly to the microcontroller pins. It is activated only during measurements, which significantly reduces power consumption....
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ADCP Observations of Diel Vertical Migration of Biological Layers in Gulf of Gdańsk
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A Power-Efficient Digital Technique for Gain and Offset Correction in Slope ADCs
PublikacjaIn this brief, a power-efficient digital technique for gain and offset correction in slope analog-to-digital converters (ADCs) has been proposed. The technique is especially useful for imaging arrays with massively parallel image acquisition where simultaneous compensation of dark signal non-uniformity (DSNU) as well as photo-response non-uniformity (PRNU) is critical. The presented approach is based on stopping the ADC clock by...
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Self-Testing of Analog Parts Terminated by ADCs Based on Multiple Sampling of Time Responses
PublikacjaA new approach for self-testing of analog parts terminated by analog-to-digital converters in mixed-signal electronic microsystems controlled by microcontrollers is presented. It is based upon a new fault diagnosis method using a transformation of the set of voltage samples of the time response of a tested analog part to a square impulse into localization curves placed in a multidimensional measurement space. The method can be used...
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An Ultra-Low-Energy Analog Comparator for A/D Converters in CMOS Image Sensors
PublikacjaThis paper proposes a new solution of an ultra-low-energy analog comparator, dedicated to slope analog-to-digital converters (ADC), particularly suited for CMOS image sensors (CISs) featuring a large number of ADCs. For massively parallel imaging arrays, this number may be as high as tens-hundreds of thousands ADCs. As each ADC includes an analog comparator, the number of these comparators in CIS is always high. Detailed analysis...
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A random signal generation method for microcontrollers with DACs
PublikacjaA new method of noise generation based on software implementation of a 7-bit LFSR based on a common polynomial PRBS7 using microcontrollers equipped with internal ADCs and DACs and a microcontroller noise generator structure are proposed in the paper. Two software applications implementing the method: written in ANSI C and based on the LUT technique and written in AVR Assembler are also proposed. In the method the ADC results are...
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An idea of an approach to self-testing of mixed signal systems based on a quadratic function stimulation
PublikacjaA new approach to self-testing of the analog parts of mixed-signal electronic systems controlled by microcontrollers equipped with an ADC and a DAC is presented. It is based on a BIST and a new fault diagnosis method. A novelty is the use of the DAC as a component of the BIST, allowing to generate a stimulating signal with a quadratic function shape. It contributes to a better extraction of information about the state of the circuit...
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A compact smart sensor based on a neural classifier for objects modeled by Beaunier's model
PublikacjaA new solution of a smart microcontroller sensor based on a simple direct sensor-microcontroller interface for technical objects modeled by two-terminal networks and by the Beaunier’s model of anticorrosion coating is proposed. The tested object is stimulated by a square pulse and its time voltage response is sampled four times by the internal ADC of microcontroller. A neural classifier based on measurement data classifies the...
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Usage of Two-Center Basis Function Neural Classifiers in Compact Smart Resistive Sensors
PublikacjaA new solution of the smart resistance sensorwith the Two-Center Basis Function (TCBF) neuralclassifier, for which the resistance sensor is a component ofan anti-aliasing filter of an ADC is proposed. Thetemperature measurement procedure is based on excitationof the filter by square impulses, sampling time response ofthe filter and processing measured voltage values by theTCBF classifier. All steps of the measurement procedure...
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A method of measuring RLC components for microcontroller systems
PublikacjaA new method of measuring RLC components for microcontroller systems dedicated to compact smart impedance sensors based on a direct sensor-microcontroller interface is presented. In the method this direct interface composed of a reference resistor connected in series with the tested sensor impedance is stimulated by a square wave generated by the microcontroller, and then its voltage response is sampled by an internal ADC of the...
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Diagnostyka analogowych filtrów wielosekcyjnych oparta na magistrali testującej IEEE1149.1
PublikacjaPrzedstawiono nową koncepcję testera JTAG BIST do samo-testowania torów analogowych opartych na wielosekcyjnych filtrach wyższego rzędu w mieszanych sygnałowo mikrosystemach elektronicznych sterowanych mikrokontrolerami i wyposażonych w magistralę testującą IEEE1149.1 (JTAG). Bazuje ona na metodzie diagnostycznej opartej na przekształce-niu transformującym próbki odpowiedzi czasowych kolejnych sekcji filtra pobudzonego impulsem...
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A testing method of analog parts of mixed-signal electronic systems equipped with the IEEE1149.1 test bus
PublikacjaA new solution of the JTAG BIST for testing analog circuits in mixed-signal electronic microsystems controlled by microcontrollers and equipped with the IEEE1149.1 bus is presented. It is based on a new fault diagnosis method in which an analog circuit is stimulated by a buffered signal from the TMS line, and the time response of the circuit to this signal is sampled by the ADC equipped with the JTAG. The method can be used for...
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Using an IEEE1149.1 Test Bus for Fault Diagnosis of Analog Parts of Electronic Embedded Systems
PublikacjaThe new solution of a BIST called the JTAG BIST for self-testing of analog parts of electronic embedded systems is presented in the paper. The JTAG BIST consists of the BCT8244A and SCANSTA476 integrated circuits of Texas Instruments controlled via the IEEE 1149.1 bus. The BCT8244A is a scan test device with octal buffers, and the SCANSTA476 is a 12-bit ADC with 8 analog input channels. Self-testing approach is based on the fault...
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Selection of excitation signals for high-impedance spectroscopy
PublikacjaA method of fast impedance spectroscopy of technical objects with high impedance (|Zx| > 1 GOhm) is evaluated in this paper. An object is excited with a signal generated by a digital-to-analog converter (DAC) located on the U2531A DAQ module. Response signals proportional to current flowing through and voltage across the measured object are sampled by analog-to-digital converters (ADC) in the DAQ module. The object impedance spectrum...
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Programmable Input Mode Instrumentation Amplifier Using Multiple Output Current Conveyors
PublikacjaIn this paper a programmable input mode instrumentation amplifier (IA) utilising second generation, multiple output current conveyors and transmission gates is presented. Its main advantage is the ability to choose a voltage or current mode of inputs by setting the voltage of two configuration nodes. The presented IA is prepared as an integrated circuit block to be used alone or as a sub-block in a microcontroller or in a field...
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Time-domain measurement methods for R, L and C sensors based on aversatile direct sensor-to-microcontroller interface circuit
PublikacjatIn the paper new time-domain measurement methods for determining values of resistive (R), inductive(L) and capacitive (C) sensors based on a versatile direct sensor-to-microcontroller interface for microcon-trollers with internal analog-to-digital converters (ADCs) and analog comparators (ACs) are presented.The interface circuit consists of a reference resistor Rrworking as a voltage divider, a given R, L or C sensorand a microcontroller...
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Multi-Channel Virtual Instrument for Measuring Temperature—A Case Study
PublikacjaThe article presents the hardware and software configuration of the developed multi-channel temperature measurement system as well as calibration procedures and measurement results verifying the properties of measurement channels. The system has been developed and dedicated primarily for measuring the temperature distribution in a laboratory model simulating underground power lines. With the adopted configuration of the analog...