Dewetting of silver films detected by XPS method - Open Research Data - Bridge of Knowledge

Search

Dewetting of silver films detected by XPS method

Description

Dewetting of silver thin films was detected by XPS method. Thin metallic films were deposited by magnetron sputtering method. Formation of nanostructures , as a result of thermal annealing, was confirmed by SEM microscope. For comparision three samples were measured. Bulg gold, as-deposited silver film with thickness of 3 nm and nanostructures.

Dataset file

Ag_XPS.zip
287.7 kB, S3 ETag a953e4fd82857f53142f617023648d8a-1, downloads: 7
The file hash is calculated from the formula
hexmd5(md5(part1)+md5(part2)+...)-{parts_count} where a single part of the file is 512 MB in size.

Example script for calculation:
https://github.com/antespi/s3md5
download file Ag_XPS.zip

File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.
Software:
origin

Details

Year of publication:
2021
Verification date:
2021-06-24
Creation date:
2017
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/kfed-yf32 open in new tab
Verified by:
Gdańsk University of Technology

Keywords

Cite as

seen 57 times