SEM inwestigation of the silver nanostructures - Open Research Data - Bridge of Knowledge

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SEM inwestigation of the silver nanostructures

Description

Silver thin films with a thickness of 1nm, 3nm, 5nm, 7nm and 9nm were deposited by a table-top magnetron sputtering unit in a pure argon plasma from a high-purity silver target. Silicon wafers was used as a substrates. As-deposired films were annealed in Ar atmosphere at 550 Celsius degree for 15 minutes.As a result of annealing, Ag nanostructures formed on silicon. Morphology of obtained nanostructures was measured by SEM technique (FEI Quanta microscope).

Dataset file

Ag_SEM.zip
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License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
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Details

Year of publication:
2021
Verification date:
2021-07-05
Creation date:
2018
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/jnrk-sy18 open in new tab
Verified by:
Gdańsk University of Technology

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