X-ray diffraction of ZnIn2S4 layers on TiO2NT and FTO annealed at different temperatures - Open Research Data - Bridge of Knowledge

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X-ray diffraction of ZnIn2S4 layers on TiO2NT and FTO annealed at different temperatures

Description

Data show XRD results for ZnIn2S4 layers deposited using hydrothermal method on FTO glass and TiO2 nanotubes. The layers were annealed in air atmosphere at 300, 400 and 500 oC.

Dataset file

XRD FTO_ZIS TiO2NT_ZIS.zip
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download file XRD FTO_ZIS TiO2NT_ZIS.zip

File details

License:
Creative Commons: 0 1.0 open in new tab
CC 0
Public Domain Dedication
Raw data:
Data contained in dataset was not processed.

Details

Year of publication:
2023
Verification date:
2023-04-17
Creation date:
2022
Dataset language:
English
Fields of science:
  • physical sciences (Natural sciences)
  • chemical sciences (Natural sciences)
DOI:
DOI ID 10.34808/04jn-xy57 open in new tab
Verified by:
Gdańsk University of Technology

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