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Search results for: SEKWENCYJNY TEST ILORAZOWY
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Search results for: SEKWENCYJNY TEST ILORAZOWY

  • TEST

    Journals

    ISSN: 1133-0686 , eISSN: 1863-8260

  • Test PDF

    Publication
    • Ł. Pilorz

    - Year 2018

    Test PDF

  • IEEE Design & Test

    Journals

    ISSN: 2168-2356

  • Genetyka człowieka - TEST 14.06.2021

    e-Learning Courses
    • P. Sachadyn

    Test  zaliczeniowy z genetyki człowieka 14.06.2021

  • Materiały Czujnikowe, Test Zaliczający

    e-Learning Courses
    • R. Pomećko

    Zdalny test zaliczający z przedmiotu Materiały Czujnikowe

  • Placement Test - jezyk angielski

    e-Learning Courses
    • M. Fenc
    • U. Kamińska
    • I. Mokwa-Tarnowska

    Placement Test dla wszystkich, którzy chcą sprawdzić swoje umiejętności.

  • Comparison of the impact test and the harmonic test in measurements of natural resonant frequencies of circular saw blades

    In this paper results of measurements of natural resonant frequencies of circular saw blades with the impact test and the harmonic test are presented. Comparison of these two methods revealed that during testing of circular saw blades, in which bodies the open and closed notches (cuts) for cleaning of knives are present, with the harmonic test method it has been observed appearing of quasi-twin resonant frequencies, whereas the...

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  • Quality of Test Specification by Application of Patterns

    Publication

    - Year 2008

    Embedded system and software testing requires sophisticated methods, which are nowadays frequently supported by application of test patterns. This eases the test development process and contributes to the reusability and maintainability of the test specification. However, it does not guarantee the proper level of quality and test coverage in d ifferent dimensions of the test specification. In this paper the quality of the test...

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  • Test Design Patterns for Embedded Systems,

    Publication
    • J. Zander
    • A. M. Perez
    • I. Schieferdecker
    • Z. R. Dai

    - Year 2007

    Test suites for embedded systems are typically created from scratch using dif- ferent, often inadequate methods. In consequence, industry branches dealing with software-intensive embedded systems have to cope with quality problems, even though test processes are particularly time-consuming and costly. Based on an evolving model-based testing methodology we introduce test design patterns for simplifying and accelerating...

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  • The smoothness test for a density function

    The problem of testing hypothesis that a density function has no more than μ derivatives versus it has more than μ derivatives is considered. For a solution, the L2 norms of wavelet orthogonal projections on some orthogonal ‘‘differences’’ of spaces from a multiresolution analysis is used. For the construction of the smoothness test an asymptotic distribution of a smoothness estimator is used. To analyze that asymptotic distribution,...

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