Search results for: partially reflecting surface (PRS)

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Refractive index measurement in the range of 1.3 – 1.5 for 1550 nm wavelength (2nd serie)
Open Research Data
open access
- M. Szczerska
- M. Kosowska
- series: Refractive index measurement
The low-coherence refractive index measurements of certified liquid samples provided by Cargille Labs were performed. The measurement system consisted of a broadband light source (central wavelength of 1550 nm), an optical spectrum analyzer, a 2x1 fiber-optic coupler (50:50 power split), and single-mode telecommunication optical fibers. A micromechanical...
Refractive index measurement in the range of 1.3 – 1.5 for 1550 nm wavelength (1st serie)
Open Research Data
version 1.0 open access
- M. Szczerska
- M. Kosowska
- series: Refractive index measurement
The low-coherence refractive index measurements of certified liquid samples provided by Cargille Labs were performed. The measurement system consisted of a broadband light source (central wavelength of 1550 nm), an optical spectrum analyzer, a 2x1 fiber-optic coupler (50:50 power split), and single-mode telecommunication optical fibers. A micromechanical...

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Search results for: partially reflecting surface (PRS)

Refractive index measurement in the range of 1.3 – 1.5 for 1550 nm wavelength (2nd serie)

Refractive index measurement in the range of 1.3 – 1.5 for 1550 nm wavelength (1st serie)